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Advanced Techniques for Embedded Systems Design and Test pp 231–259Cite as

Advances in ATPG by Exploiting the Behavioral View

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Abstract

In general three representations of a digital circuit or system can be distinguished,

  • the structural at switch- or gate-level,

  • the functional and

  • the behavioral

on base of which, in accordance with an appropriate fault model, test patterns are generated. Hierarchical representations encompass two or more of these levels.

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Authors
  1. Walter Geisselhardt
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  2. Heinz-Dieter Huemmer
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Editor information

Editors and Affiliations

  1. Technical University of Madrid, Madrid, Spain

    Juan Carlos López

  2. Complutense University of Madrid, Madrid, Spain

    Román Hermida

  3. Gerhard-Mercator-University Duisburg, Duisburg, Germany

    Walter Geisselhardt

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© 1998 Springer Science+Business Media Dordrecht

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Geisselhardt, W., Huemmer, HD. (1998). Advances in ATPG by Exploiting the Behavioral View. In: López, J.C., Hermida, R., Geisselhardt, W. (eds) Advanced Techniques for Embedded Systems Design and Test. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-4419-4_10

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  • DOI: https://doi.org/10.1007/978-1-4757-4419-4_10

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4419-5031-4

  • Online ISBN: 978-1-4757-4419-4

  • eBook Packages: Springer Book Archive

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