Abstract
There are numerous reasons for operating electronic devices and circuits below room temperature:
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1)
improved performance such as:
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— Higher speed due to improved transport properties, ideal subthreshold operation and reduced interconnect resistance
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— Lower thermal electrical noise
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— Reduction or suppression of parasitic effects leading to an improvement of device reliability, for instance latch-up and leakage currents for CMOS circuits or electromigration for the interconnects
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— Increased thermal conductivity for silicon and many other materials allowing higher integration density;
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2)
refined characterization methods, for instance dealing with the determination of interface or bulk defects, the study of scattering mechanisms or the investigation of quantum effects;
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3)
physical and technological limitations for the ultimate integration of silicon circuits down to nanometric dimensions which could be overcome using low temperature electronics;
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4)
need to couple electronics to other devices which are in a cold environment, such as read-out circuits with cooled detectors;
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5)
study and use of physical phenomena that occur only or are magnified at low temperature such as single electron effects or superconductivity;
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6)
a conventional electronic circuit has to operate in a wide temperature range, from 125°C down to −55°C, and therefore needs also to be evaluated at low temperature. Note also that the lowest temperature observed on earth is about −90°C. Other very interesting temperature ranges are liquid nitrogen (77K = −196°C=−320°F) and liquid helium temperatures (4K=−269°C=−452°F).
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© 2001 Springer Science+Business Media Dordrecht
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Balestra, F., Ghibaudo, G. (2001). General Introduction. In: Balestra, F., Ghibaudo, G. (eds) Device and Circuit Cryogenic Operation for Low Temperature Electronics. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-3318-1_1
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DOI: https://doi.org/10.1007/978-1-4757-3318-1_1
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-4898-4
Online ISBN: 978-1-4757-3318-1
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