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Characterization of Deformed Microstructures

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Book cover Electron Backscatter Diffraction in Materials Science

Abstract

Over the past two decades or so, electron backscatter diffraction (EBSD) has become an increasingly important analytical technique in characterizing polycrystalline microstructures. As this tool was championed by the texture analysis community in the early stages of its application to materials research, characterization of deformed materials has been a significant fraction of the EBSD applications research published in the open literature. This chapter focuses on the application of EBSD to the characterization of deformed materials.

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Author information

Authors and Affiliations

  1. TexSEM Laboratories (TSL), Draper, UT, 84020, USA

    David P. Field

  2. Alcoa Technical Center, Alcoa Center, PA, 15069-0001, USA

    Hasso Weiland

Authors
  1. David P. Field
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  2. Hasso Weiland
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Editor information

Editors and Affiliations

  1. Lawrence Livermore National Laboratory, Livermore, California, USA

    Adam J. Schwartz  & Mukul Kumar  & 

  2. Brigham Young University, Provo, Utah, USA

    Brent L. Adams

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© 2000 Springer Science+Business Media New York

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Field, D.P., Weiland, H. (2000). Characterization of Deformed Microstructures. In: Schwartz, A.J., Kumar, M., Adams, B.L. (eds) Electron Backscatter Diffraction in Materials Science. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-3205-4_17

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  • DOI: https://doi.org/10.1007/978-1-4757-3205-4_17

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-3207-8

  • Online ISBN: 978-1-4757-3205-4

  • eBook Packages: Springer Book Archive

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