Abstract
Electron backscatter diffraction (EBSD) has emerged in recent years as a powerful tool for the characterization of micro- or meso-structure by measurements in orientation space. This is evident from the numerous examples of the applications of this technique given in other chapters of this volume. As discussed in the previous chapters, most EBSD acquisition software provide the x- and y-coordinates, the three Euler angles, and a number of other parameters including the quality of the electron backscatter diffraction pattern (EBSP) and the confidence in indexing. Commercially available software contains a myriad of functions to allow the investigator to analyze many aspects of the material micro structure. However, for certain problems in materials science, standard, commercially available software is unable to provide all the information that is required for the analysis. This chapter will explore additional representations of the EBSD dataseis and data processing software that have been developed to address particular problems encountered during investigations. Specific examples include: “clean-up” of dataseis; mapping of lattice rotations in deformed single crystals; three-dimensional reconstruction of the microstructure; and applications in the area of grain boundary engineering such as statistical information on the frequency of grain boundaries in deformed and annealed polycrystals, analysis of triple junction distributions, and mapping of the random grain boundary connectivity in the microstructure.
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King, W.E., Stölken, J.S., Kumar, M., Schwartz, A.J. (2000). Strategies for Analyzing EBSD Datasets. In: Schwartz, A.J., Kumar, M., Adams, B.L. (eds) Electron Backscatter Diffraction in Materials Science. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-3205-4_14
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DOI: https://doi.org/10.1007/978-1-4757-3205-4_14
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