Abstract
The thermal cycling life of flip chip assemblies is often limited by solder joint fatigue. The reliability can be increased by a factor 10 using an underfill material. However, the solder joint reliability is still very dependent on the choice of the underfill material. Using thermo-mechanical simulations, based on non linear finite element simulations, the induced inelastic strains in the solder joints are calculated, and give a value for the expected thermal fatigue life. Combing these FE simulations with an optimisation tool, the optimal underfill material is proposed. The optimisation is based on a parameter sensitivity analysis using DOE techniques. The optimal properties for the underfill are a high elastic modulus and a CTE closely matched to the CTE of the solder joint.
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© 2000 Springer Science+Business Media Dordrecht
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Vandevelde, B., Beyne, E. (2000). Thermal Fatigue Reliability Optimisation of Flip Chip Assemblies. In: Zhang, G.Q., Ernst, L.J., de Saint Leger, O. (eds) Benefiting from Thermal and Mechanical Simulation in Micro-Electronics. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-3159-0_11
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DOI: https://doi.org/10.1007/978-1-4757-3159-0_11
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4419-4873-1
Online ISBN: 978-1-4757-3159-0
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