Abstract
The electron is a low mass, negatively charged particle. As such, it can easily be deflected by passing close to other electrons or the positive nucleus of an atom. These Coulomb (electrostatic) interactions cause the electron scattering which is the process that makes TEM feasible. We will also discuss how the wave nature of the electron gives rise to diffraction effects. What we can already say is that if the electrons didn’t scatter, then there would be no mechanism to create TEM images or diffraction patterns and no source of spectroscopic data. So it is essential to understand both the particle approach and the wave approach to electron scattering in order to be able to interpret all the information that comes from a TEM. Electron scattering from materials is a reasonably complex area of physics, but it isn’t necessary to develop a detailed comprehension of scattering theory to be a competent microscopist.
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References
General References
Fishbane, P.M., Gasiorowicz, S., and Thornton, S.T. (1993) Physics for Scientists and Engineers, Prentice Hall, Englewood Cliffs, New Jersey.
Goodman, J.W. (1968) Introduction to Fourier Optics,McGraw-Hill, New York. Reissued in 1988 and an excellent source for the advanced student.
Hecht, E. (1987) Optics, 2nd edition, Addison-Wesley, Reading, Massachusetts.
Klein, M.V. and Furtak, T.E. (1985) Optics, 2nd edition, Wiley, New York.
Mott, N.F. and Massey, H.S.W. (1965) The Theory of Atomic Collisions, Oxford University Press, New York.
Smith, F.G. and Thomson, J.H. (1988) Optics, 2nd edition, Wiley, New York.
Specific References
Hall, C.E. (1953) Introduction to Electron Microscopy, McGraw-Hill, New York.
Heidenreich, R.D. (1964) Fundamentals of Transmission Electron Microscopy, Interscience, New York.
Joy, D.C. (1995) Monte Carlo Modeling for Electron Microscopy and Microanalysis, Oxford University Press, New York
Joy, D.C., Romig, A.D. Jr., and Goldstein, J.I., Eds. (1986) Principles of Analytical Electron Microscopy, Plenum Press, New York.
Newbury, D.E., Joy, D.C., Echlin, P., Fiori, C.E., and Goldstein, J.I. (1986) Advanced Scanning Electron Microscopy and X-ray Microanalysis, Plenum Press, New York.
Rhodes, R. (1986) The Making of the Atomic Bomb, p. 282, Simon and Schuster, New York.
Rhodes, R. (1995) Dark Sun: The Making of the Hydrogen Bomb, p. 423, Simon and Schuster, New York.
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Williams, D.B., Carter, C.B. (1996). Scattering and Diffraction. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2519-3_2
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DOI: https://doi.org/10.1007/978-1-4757-2519-3_2
Publisher Name: Springer, Boston, MA
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