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Alignment by Cross-Correlation

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Electron Tomography

Abstract

Highest precision in the alignment of projections is one of the prerequisites of tomography. The effects of random translational alignment errors on the reconstruction can be appreciated by considering the much simpler situation where a given number of images containing the same motif are averaged.

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References

  • Frank, J. (1980). The role of correlation techniques in computer image processing, in Computer Processing of Electron Microscope Images (P. W. Hawkes, ed.), pp. 187–122. Springer-Verlag, Berlin.

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  • Frank, J., McEwen, B. F., Radermacher, M., Turner, J. N., and Rieder, C. L. (1987). Three-dimensional tomographic reconstruction in high voltage electron microscopy. J. Electron Microsc. Tech. 6:193–205.

    Article  Google Scholar 

  • Frank, J. and Radermacher, M. (1986). Three-dimensional reconstruction of nonperiodic macromolecular assemblies, in Advanced Techniques in Biological Electron Microscopy III (J. K. Koehler, ed.), pp. 1–72. Springer-Verlag, Berlin.

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  • Guckenberger, M. (1982). Determination of a common origin in the micrographs of tilt series in threedimensional electron microscopy. Ultramicroscopy 9:167–174.

    Article  Google Scholar 

  • Saxton, W. O. and Frank, J. (1976). Motif detection in quantum noise-limited electron micrographs by cross-correlation. Ultramicroscopy 2:219–227.

    Article  Google Scholar 

  • Skoglund, U. and Daneholt, B. (1986). Electron microscope tomography. Trends in Biochemical Sciences 11:499–503.

    Article  CAS  Google Scholar 

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Author information

Authors and Affiliations

  1. Wadsworth Center for Laboratories and Research, Wadsworth Center for Laboratories and Research, Albany, New York, USA, 12201-0509

    Joachim Frank & Bruce F. McEwen

  2. Department of Biomedical Sciences, School of Public Health, State University of New York at Albany, 40126, Bologna, Italy

    Joachim Frank

Authors
  1. Joachim Frank
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  2. Bruce F. McEwen
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Editor information

Editors and Affiliations

  1. Wadsworth Center for Laboratories and Research, New York State Department of Health, Albany, New York, USA

    Joachim Frank

  2. Department of Biomedical Sciences, School of Public Health, State University of New York at Albany, Albany, New York, USA

    Joachim Frank

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© 1992 Springer Science+Business Media New York

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Frank, J., McEwen, B.F. (1992). Alignment by Cross-Correlation. In: Frank, J. (eds) Electron Tomography. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2163-8_9

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  • DOI: https://doi.org/10.1007/978-1-4757-2163-8_9

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-2165-2

  • Online ISBN: 978-1-4757-2163-8

  • eBook Packages: Springer Book Archive

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