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Adaptive Mesh Refinement for 2-D Numerical Analysis of Semiconductor Devices

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Computational Electronics

Abstract

A new mesh refinement criterion is proposed based on the inter-mesh approximation residual (IMAR). IMAR provides an accurate and reliable mesh refinement criterion for the numerical analysis of PDE regardless of its decretization and solution methods. The numerical examples are presented along with the computational algorithm of IMAR and practical scheme of adaptive mesh refinement (AMR) which is implemented on 2D device simulator TSAR.

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© 1991 Springer Science+Business Media New York

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Son, I., Tang, Tw., Eydeland, A. (1991). Adaptive Mesh Refinement for 2-D Numerical Analysis of Semiconductor Devices. In: Hess, K., Leburton, J.P., Ravaioli, U. (eds) Computational Electronics. The Springer International Series in Engineering and Computer Science, vol 113. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2124-9_5

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  • DOI: https://doi.org/10.1007/978-1-4757-2124-9_5

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4419-5122-9

  • Online ISBN: 978-1-4757-2124-9

  • eBook Packages: Springer Book Archive

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