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Lifetime Data Analysis

  • Chapter
Nondestructive Evaluation of Semiconductor Materials and Devices

Part of the book series: NATO Advanced Study Institutes Series ((NSSB,volume 46))

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Abstract

The outcome of electronic-component reliability studies is usually a sample of lifetimes and the task is then one of drawing inferences about the conceptual population from which the sample has been withdrawn. Quite often “lifetime” will refer to the interval between the real time at which a component enters service and the later time at which it fails to satisfy its performance specification for any reason. The term may also be applied however to a lifespan determined by specified causes only. In the laboratory, lifetimes may arise from simulated service operation or operation under conditions deliberately different from service, usually more onerous. Still further, lifetimes may be measured on only an elementary part of a component.

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Author information

Authors and Affiliations

  1. Post Office Research Centre, Martlesham Heath, Ipswhich, Ip5 7RE, England

    F. H. Reynolds

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  1. F. H. Reynolds
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Editor information

Editors and Affiliations

  1. The University of Pennsylvania, Philadelphia, Pennsylvania, USA

    Jay N. Zemel

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© 1979 Springer Science+Business Media New York

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Reynolds, F.H. (1979). Lifetime Data Analysis. In: Zemel, J.N. (eds) Nondestructive Evaluation of Semiconductor Materials and Devices. NATO Advanced Study Institutes Series, vol 46. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-1352-7_14

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  • DOI: https://doi.org/10.1007/978-1-4757-1352-7_14

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-1354-1

  • Online ISBN: 978-1-4757-1352-7

  • eBook Packages: Springer Book Archive

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