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Current-Voltage Characteristics of p-n-p-n Structures Governed By Recombination, Generation, and Avalanche Multiplication Processes in p-n Junctions

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Physics of p-n Junctions and Semiconductor Devices

Abstract

The principal parameters of the current-voltage characteristics of silicon planar thyristors are calculated taking into account the recombination, generation, and avalanche multiplication in p-n junctions. Analytic expressions are obtained for the determination of the turn-off current, critical gate current, and turn-off gain of an asymmetrical silicon planar thyristor. The dependence of the turn-off current on the gate current and the dependence of the turn-off gain on the anode current are calculated. Allowance is made for the avalanche multiplication of carriers in the central p-n junction and analytic expressions are derived for the turn-on current and the breakover voltage. It is shown that the breakover voltage of planar thyristors designed for low-voltage operation is close to the breakdown voltage of the central p-n junction, which is due to the low value of the leakage current of this junction.

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© 1971 Springer Science+Business Media New York

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Kuz’min, V.A., Parmenov, Y.A. (1971). Current-Voltage Characteristics of p-n-p-n Structures Governed By Recombination, Generation, and Avalanche Multiplication Processes in p-n Junctions. In: Ryvkin, S.M., Shmartsev, Y.V. (eds) Physics of p-n Junctions and Semiconductor Devices. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-1232-2_65

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  • DOI: https://doi.org/10.1007/978-1-4757-1232-2_65

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-1234-6

  • Online ISBN: 978-1-4757-1232-2

  • eBook Packages: Springer Book Archive

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