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Experimental Techniques for the Study of Statistically Distributed Defects

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Characterization of Crystal Growth Defects by X-Ray Methods

Part of the book series: Nato Advanced Study Institutes Series ((NSSB,volume 63))

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Abstract

Because phonon energies \(\hbar \omega \sim kT \sim 5x{10^{ - 4}}\) to 0.5 eV cannot beresolved in x-ray scattering experiments until now, inelastic scattering experiments are best performed with neutrons and are not discussed in this lecture. For the application of neutron diffraction techniques to the study of disordered crystals we would like to refer to a recent review article by Schmatz [1], which includes a presentation of recent results from neutron small angle scattering, and diffuse elastic scattering by nonmagnetic crystals as well as scattering by disordered magnetic systems.

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Authors
  1. Jochen R. Schneider
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Editor information

Editors and Affiliations

  1. Department of Physics, Durham University, Durham, UK

    Brian K. Tanner

  2. Department of Engineering, Warwick University, Coventry, UK

    D. Keith Bowen

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© 1980 Springer Science+Business Media New York

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Schneider, J.R. (1980). Experimental Techniques for the Study of Statistically Distributed Defects. In: Tanner, B.K., Bowen, D.K. (eds) Characterization of Crystal Growth Defects by X-Ray Methods. Nato Advanced Study Institutes Series, vol 63. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-1126-4_8

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  • DOI: https://doi.org/10.1007/978-1-4757-1126-4_8

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-1128-8

  • Online ISBN: 978-1-4757-1126-4

  • eBook Packages: Springer Book Archive

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