Abstract
The technical importance of defects has already been considered from the viewpoint of the overall manufacturing process. In this chapter a different approach will be taken and the subject considered from the point of view of the device operation.
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© 1980 Springer Science+Business Media New York
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Milne, A.D. (1980). The Technical Importance of Growth Defects. In: Tanner, B.K., Bowen, D.K. (eds) Characterization of Crystal Growth Defects by X-Ray Methods. Nato Advanced Study Institutes Series, vol 63. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-1126-4_2
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DOI: https://doi.org/10.1007/978-1-4757-1126-4_2
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4757-1128-8
Online ISBN: 978-1-4757-1126-4
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