Abstract
Synchrotron radiation has been used as an X-ray source for topography since 1974. A significant number of results have already been obtained by means of white beam topography as reported by Miltat [1]. However, since 1978, topographic experiments where a monochromatized beam was first extracted from the white spectrum prior to reflection in the sample have also been performed. When thinking of physical studies where the observation technique is topography, one has thus to decide which among the following imaging methods is the most appropriate: white beam topography, Lang or double-crystal topography using laboratory generators or monochromatized synchrotron radiation topography. The purpose of the present chapter is first to produce some guide lines which will help in promoting monochromatized synchrotron radiation topography and secondly to give typical examples of applications.
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References
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Sauvage, M. (1980). Monochromatic Synchrotron Radiation Topography. In: Tanner, B.K., Bowen, D.K. (eds) Characterization of Crystal Growth Defects by X-Ray Methods. Nato Advanced Study Institutes Series, vol 63. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-1126-4_18
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DOI: https://doi.org/10.1007/978-1-4757-1126-4_18
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