Abstract
We present a calculation of the hole levels in a GaAs-GaA1As superlattice in a magnetic field parallel to the layers, when the magnetic length is greater or comparable with the superlattice period. A comparison with the electronic levels in the same field configuration shows noticeable analogies, but also differences related to the more complex hole subband structure. A calculation of interband magneto-optical transition intensities is also presented.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
G. Belle, J. C. Maan, G. Weimann Solid State Commun. 56,65, 1985; G. Belle, J. C. Maan, G. Weimann Surf. Sci. 170, 611, 1986;
T. Duffield, R. Bhat, M. Koza, F. De Rosa, D. M. Hwang, P. Grabbe and S. J. Allen, Jr. Phys. Rev. Lett. 56, 2724, 1986; T. Duffield, R. Bhat, M. Koza, K. M. Rush and S. J. Allen, Jr. Phys. Rev. Lett. 59, 2693, 1987;
J. C. Maan, Festkörperprobleme 27, ed. by P. Grosse, p. 137, 1987;
J. M. Luttinger, Phys. Rev 102, 1030, 1956;
M. Altarelli, G. Platero Surf. Sci 196, 540, 1988;
A. Chomette, B. Lambert, B. Deveaud, F. Clerot, A. Regreny, G. Bastard Europhys. Lett. 4, 461, 1987;
A. Fasolino, M. Altarelli in Springer Series in Solid State Sciences, vol. 53, ed. by G. Bauer, F. Kuchar and H. Heinrich ( Springer, Berlin ) 1984, p. 176;
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1989 Plenum Press, New York
About this chapter
Cite this chapter
Fasolino, A., Altarelli, A.M. (1989). Effect of a Parallel Magnetic Field on the Hole Levels in Semiconductor Superlattices. In: Abram, R.A., Jaros, M. (eds) Band Structure Engineering in Semiconductor Microstructures. NATO ASI Series, vol 189. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-0770-0_31
Download citation
DOI: https://doi.org/10.1007/978-1-4757-0770-0_31
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4757-0772-4
Online ISBN: 978-1-4757-0770-0
eBook Packages: Springer Book Archive