Skip to main content

UHV Microbalance and Quartz Oscillator at Low Temperatures

  • Conference paper

Abstract

The intensities of beams of rubidium atoms were determined simultaneously by two independent methods with a magnetically compensated microbalance and with a resonating quartz oscillator, the latter serving as the pan of the microbalance. Both systems were operating at 180 K inside a cooled glass Dewar. Taking into account the temperature changes of the weighing ensemble during deposition caused mainly by the condensation of Rb atoms and the warming up of the surrounding Dewar, the Rb atom beam intensities, determined by the microbalance and independently by the frequency shift of the resonating quartz, agree to within 2%. In a separate experimental setup the measurements of the Rb atom beam intensities with a calibrated Pt-ionization foil and with the quartz oscillator at 81 K agree also to within 2%.

This is a preview of subscription content, log in via an institution.

Buying options

Chapter
USD   29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD   39.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD   54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Learn about institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. G. Sauerbrey, Z. Phys., 155, 206 (1959).

    Article  Google Scholar 

  2. M. P. Lostis, J. Phys. Radium, 20, 258 (1959).

    Article  Google Scholar 

  3. J. C. Bruyère, J. Phys. Radium, 21, 222A (1960).

    Google Scholar 

  4. A. R. Wolter, J. Appl. Phys., 36, 2377 (1965).

    Article  Google Scholar 

  5. T. E. Hartmann, J. Vac. Sci. Technol., 2, 239 (1965).

    Google Scholar 

  6. J. Edgecombe, J. Vac. Sci. Technol., 3, 28 (1966).

    Google Scholar 

  7. B. W. Kington, Marconi Instr., 10, 81 (1966).

    Google Scholar 

  8. W. H. Lawson, J. Sci. Instr., 44, 919 (1967).

    Article  Google Scholar 

  9. H. K. Pulker, Z. Angew Phys., 20, 537 (1966).

    Google Scholar 

  10. H. J. Ishkin and V. S. Zazulin, Instr. Exptl. Techniques, 1, 44 (1963).

    Google Scholar 

  11. D. Hillecke and R. Niedermayer, Vakuum-Technik, 14, 69 (1965).

    Google Scholar 

  12. R. Niedermayer, N. Gladkich, and D. Hillecke, Vacuum Microbalance Techniques, Vol. 5 (K. H. Berndt, ed.) Plenum Press, New York (1966), p. 817.

    Google Scholar 

  13. H. L. Eschbach and E. W. Kruidhof, Vacuum Microbalance Techniques, Vol. 5 (K. H. Berndt, ed.), Plenum Press, New York (1966), p. 207.

    Google Scholar 

  14. G. Sauerbrey, A. E. Ü., 18, 617 (1964).

    Google Scholar 

  15. H. Mayer, R. Niedermayer, W. Schroen, D. Stünkel, and H. Göhre, Vacuum Microbalance Techniques, Vol. 3 (K. H. Berndt, ed.), Plenum Press, New York (1962), p. 75.

    Google Scholar 

  16. P. Schmider and H. Mayer, this volume, p. 207.

    Google Scholar 

  17. H. Göhre, Physik und Technik von Sorptions-und Desorptions vorgängen bei niederen Drucken, 2. Europäisches Symposium Vakuum, Frankfurt 1963.

    Google Scholar 

  18. D. Hillecke, Z. Phys., 215, 343 (1968).

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1970 Plenum Press, New York

About this paper

Cite this paper

Hillecke, D., Mayer, H. (1970). UHV Microbalance and Quartz Oscillator at Low Temperatures. In: Massen, C.H., van Beckum, H.J. (eds) Vacuum Microbalance Techniques. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-0725-0_13

Download citation

  • DOI: https://doi.org/10.1007/978-1-4757-0725-0_13

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-0727-4

  • Online ISBN: 978-1-4757-0725-0

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics