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Simultaneous Measurement of Young’s Modulus and Shear Modulus at Low Temperatures

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Advances in Cryogenic Engineering

Part of the book series: Advances in Cryogenic Engineering ((ACRE,volume 14))

Abstract

The thin-rod resonance technique for measuring elastic moduli has in the past been used in this laboratory [1] at high temperatures, and since it is desirable to make use of the same specimens for low-temperature measurements, the same technique was utilized in a cryostat. Since the times required for a sample to attain thermal equilibrium were longer at cryogenic temperatures and since problems involving dimensional stability and probe alignment were more easily solved than at higher temperatures, the system was ideally suited for automated data acquisition instrumentation.

*Work done under the auspices of the U.S. Atomic Energy Commission.

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References

  1. P. E. Armstrong and J. M. Dickinson, Rev. Sci. Instr., 36(12):1719 (1965).

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  2. R. P. Reed and R. P. Mikesell, in: Advances in Cryogenic Engineering, Vol. 10, Plenum Press, New York (1965), p. 46.

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© 1969 Springer Science+Business Media New York

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Armstrong, P.E., Eash, D.T. (1969). Simultaneous Measurement of Young’s Modulus and Shear Modulus at Low Temperatures. In: Timmerhaus, K.D. (eds) Advances in Cryogenic Engineering. Advances in Cryogenic Engineering, vol 14. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-0549-2_8

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  • DOI: https://doi.org/10.1007/978-1-4757-0549-2_8

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-0551-5

  • Online ISBN: 978-1-4757-0549-2

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