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Vacancy related structure defects in SiO2 — Cyclic cluster calculations compared with experimental results

  • Part II. Theory
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Defect Complexes in Semiconductor Structures

Part of the book series: Lecture Notes in Physics ((LNP,volume 175))

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Authors and Affiliations

  1. Physical Institute of the Technical University Budapest, H-1521 Budapest, P.O.Box 112, Hungary

    P. Deák & J. Giber

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  1. P. Deák
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  2. J. Giber
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J. Giber F. Beleznay I. C. Szép J. László

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© 1983 Springer-Verlag

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Deák, P., Giber, J. (1983). Vacancy related structure defects in SiO2 — Cyclic cluster calculations compared with experimental results. In: Giber, J., Beleznay, F., Szép, I.C., László, J. (eds) Defect Complexes in Semiconductor Structures. Lecture Notes in Physics, vol 175. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-11986-8_7

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  • DOI: https://doi.org/10.1007/3-540-11986-8_7

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  • Print ISBN: 978-3-540-11986-9

  • Online ISBN: 978-3-540-39456-3

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