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Bayesian Approach to Image Interpretation

  • Sunil K. Kopparapu
  • Uday B. Desai

Part of the The International Series in Engineering and Computer Science book series (SECS, volume 616)

Table of contents

  1. Front Matter
    Pages i-xv
  2. Pages 1-10
  3. Pages 11-33
  4. Pages 79-80
  5. Back Matter
    Pages 81-127

About this book

Introduction

Bayesian Approach to Image Interpretation will interest anyone working in image interpretation. It is complete in itself and includes background material. This makes it useful for a novice as well as for an expert. It reviews some of the existing probabilistic methods for image interpretation and presents some new results. Additionally, there is extensive bibliography covering references in varied areas.
For a researcher in this field, the material on synergistic integration of segmentation and interpretation modules and the Bayesian approach to image interpretation will be beneficial.
For a practicing engineer, the procedure for generating knowledge base, selecting initial temperature for the simulated annealing algorithm, and some implementation issues will be valuable.
New ideas introduced in the book include:
  • New approach to image interpretation using synergism between the segmentation and the interpretation modules.
  • A new segmentation algorithm based on multiresolution analysis.
  • Novel use of the Bayesian networks (causal networks) for image interpretation.
  • Emphasis on making the interpretation approach less dependent on the knowledge base and hence more reliable by modeling the knowledge base in a probabilistic framework.
Useful in both the academic and industrial research worlds, Bayesian Approach to Image Interpretation may also be used as a textbook for a semester course in computer vision or pattern recognition.

Keywords

Layout Markov Random Field Segment computer vision modeling pattern recognition

Authors and affiliations

  • Sunil K. Kopparapu
    • 1
  • Uday B. Desai
    • 2
  1. 1.Research and Development GroupAquila Technologies Private LimitedBangaloreIndia
  2. 2.SPANN Lab. Department of Electrical EngineerinIndian Institute of Technology -BombayPowai, MumbaiIndia

Bibliographic information

  • DOI https://doi.org/10.1007/b117231
  • Copyright Information Kluwer Academic Publishers 2002
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-0-7923-7372-8
  • Online ISBN 978-0-306-46996-1
  • Series Print ISSN 0893-3405
  • Buy this book on publisher's site
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