Overview
- Requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method
- Useful for any scientific or engineering background, where precise structural information is required. The book comprehensively describes the state of the art in structure determination from powder diffraction data both theoretically and practically using multiple examples of varying complexity
- Particular attention is paid to the utilization of the Internet resources, especially the well-tested and freely available computer codes designed for processing of powder diffraction data
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Table of contents (7 chapters)
Reviews
The book is well written and organized. The authors’ enthusiasm and dedication to the subject matter are clearly evident. I find the book to be not only an excellent introduction to structural characterization, but also a valuable introduction to the world of the working crystallographer. The text is rich in references to internet resources, software, literature, organizations, databases, and institutions that x-ray researchers employ routinely.
As a class text the book could be used in an introductory course for third or fourth year undergraduates in materials science, chemistry, physics, or geochemistry. The detailed structural treatments may be too much for the typical introductory x-ray diffraction course, but students would be adding a valuable text for future reference to their libraries. The sections are also ideal for more advanced coursework at the graduate level. Beyond the classroom, any researcher desiring structural information on materials would benefit from this book.
Materials Today, July/August 2004
Authors and Affiliations
Bibliographic Information
Book Title: Fundamentals of Powder Diffraction and Structural Characterization of Materials
Authors: Vitalij K. Pecharsky, Peter Y. Zavalij
DOI: https://doi.org/10.1007/b106242
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag US 2003
eBook ISBN: 978-0-387-24567-6Published: 05 December 2005
Edition Number: 1
Number of Pages: XXIII, 713
Topics: Characterization and Evaluation of Materials, Crystallography and Scattering Methods, Condensed Matter Physics, Solid State Physics, Spectroscopy and Microscopy, Physical Chemistry
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