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Total Least Squares and Errors-in-Variables Modeling

Analysis, Algorithms and Applications

  • Sabine Van Huffel
  • Philippe Lemmerling

Table of contents

  1. Front Matter
    Pages i-x
  2. Introduction to Total Least Squares and Errors-In-Variables Modeling

    1. Sabine Van Huffel, Philippe Lemmerling
      Pages 1-11
  3. Basic Concepts and Analysis in Errors-In-Variables Modeling

    1. Front Matter
      Pages 13-13
    2. Shun-ichi Amari, Motoaki Kawanabe
      Pages 15-24
    3. Christopher C. Paige, Zdeněk Strakoš
      Pages 25-34
    4. Christopher C. Paige, Zdeněk Strakoš
      Pages 35-44
  4. Total Least Squares Algorithms

    1. Front Matter
      Pages 45-45
    2. Hongbin Guo, Rosemary A. Renaut
      Pages 57-66
  5. Structured Total Least Squares Problems

    1. Front Matter
      Pages 77-77
    2. Philippe Lemmerling, Sabine Van Huffel
      Pages 79-91
    3. Nicola Mastronardi, Philippe Lemmerling, Sabine Van Huffel
      Pages 93-106
  6. Nonlinear Errors-In-Variables Models and Statistical Estimators

    1. Front Matter
      Pages 119-119
    2. Scott M. Berry, Raymond J. Carroll, David Ruppert
      Pages 121-130
    3. Chi-Lun Cheng, Hans Schneeweiss
      Pages 131-143
    4. Alexander Kukush, Silvelyn Zwanzig
      Pages 145-154
    5. Alexander Kukush, Ivan Markovsky, Sabine Van Huffel
      Pages 155-164
    6. Thomas Augustin, Regina Schwarz
      Pages 179-188
  7. Errors-In-Variables Modeling with Bounded Uncertainties

    1. Front Matter
      Pages 189-189
    2. Ali H. Sayed, Ananth Subramanian
      Pages 191-202
    3. Shivkumar Chandrasekaran, Keith Schubert
      Pages 203-212
  8. Curve Fitting

    1. Front Matter
      Pages 223-223
    2. Giansalvo Cirrincione, Maurizio Cirrincione
      Pages 235-250
    3. Ori Davidov, Alexander Goldenshluger, Roman Reidman
      Pages 251-260
  9. Errors-In-Variables Estimation in System Identification

    1. Front Matter
      Pages 269-269
    2. Torsten Söderström, Umberto Soverini, Kaushik Mahata
      Pages 271-280
    3. Roberto Guidorzi, Roberto Diversi, Umberto Soverini
      Pages 281-291
    4. Peter Verboven, Patrick Guillaume, Eli Parloo
      Pages 305-318
  10. Errors-In-Variables Estimation in Signal Processing

    1. Front Matter
      Pages 319-319
    2. Stavroula-Evita Fotinea, Ioannis Dologlou, George Carayannis
      Pages 321-330
    3. Werner Verhelst, K. Hermus, P. Lemmerling, P. Wambacq, S. Van Huffel
      Pages 331-340
    4. Da-Zheng Feng, Zheng Bao, Xian-Da Zhang
      Pages 341-350
  11. Errors-In-Variables Applications in Other Fields

    1. Front Matter
      Pages 351-351
    2. Michael K. Ng, Nirmal K. Bose, Jaehoon Koo
      Pages 365-374
    3. Richard L. Branham Jr.
      Pages 375-384
  12. Back Matter
    Pages 397-397

About this book

Introduction

In response to a growing interest in Total Least Squares (TLS) and Errors-In-Variables (EIV) modeling by researchers and practitioners, well-known experts from several disciplines were invited to prepare an overview paper and present it at the third international workshop on TLS and EIV modeling held in Leuven, Belgium, August 27-29, 2001. These invited papers, representing two-thirds of the book, together with a selection of other presented contributions yield a complete overview of the main scientific achievements since 1996 in TLS and Errors-In-Variables modeling. In this way, the book nicely completes two earlier books on TLS (SIAM 1991 and 1997). Not only computational issues, but also statistical, numerical, algebraic properties are described, as well as many new generalizations and applications. Being aware of the growing interest in these techniques, it is a strong belief that this book will aid and stimulate users to apply the new techniques and models correctly to their own practical problems.

Keywords

Analysis Curve fitting Estimator Fitting Matrix Measure algebra algorithms best fit modeling

Editors and affiliations

  • Sabine Van Huffel
    • 1
  • Philippe Lemmerling
    • 1
  1. 1.Department of Electrical EngineeringKatholieke UniversiteitLeuven-HeverleeBelgium

Bibliographic information

  • DOI https://doi.org/10.1007/978-94-017-3552-0
  • Copyright Information Springer Science+Business Media B.V. 2002
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-90-481-5957-4
  • Online ISBN 978-94-017-3552-0
  • Buy this book on publisher's site
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