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Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale

  • Renzo Rosei

Part of the NATO ASI Series book series (NSSE, volume 333)

Table of contents

  1. Front Matter
    Pages i-x
  2. O. Marti, E. Weilandt, A. Rosa, J. Staud, B. Zink, I. Hörsch et al.
    Pages 25-41
  3. E. Bauer, T. Franz, C. Koziol, G. Lilienkamp, T. Schmidt
    Pages 75-91
  4. R. Fink, M. R. Weiss, V. Wüstenhagen, P. VÄterlein, E. Umbach
    Pages 93-102
  5. H. H. Rotermund
    Pages 103-129
  6. Back Matter
    Pages 131-132

About this book

Introduction

An assessment of the recent achievements and relative strengths of two developing techniques for characterising surfaces at the nanometer scale: (i) local probe methods, including scanning tunnelling microscopy and its derivatives; and (ii) nanoscale photoemission and absorption spectroscopy for chemical analysis.
The keynote lectures were delivered by some of the world's best scientists in the field and some of the topics covered include: (1) The possible application of STM in atomically resolved chemical analysis. (2) The principles of scanning force/friction and scanning near-field optical microscopes. (3) The scanning photoemission electron microscopes built at ELETTRA and SRRC, with a description of synchrotron radiation microscopy. (4) Recent progress in the development of spatially-resolved photoelectron microscopy, especially the use of zone plate photon optics. (5) The present status of non-scanning photoemission microscopy with slow electrons. (6) the BESSY 2 project for a non-scanning photoelectron microscope with electron optics. (7) Spatially-resolved in situ reaction studies of chemical waves and oscillatory phenomena with the UV photoemission microscope.

Keywords

LEEM PEEM PES SNOM STM electron microscope electron microscopy microscopy spectroscopy

Editors and affiliations

  • Renzo Rosei
    • 1
    • 2
  1. 1.Sincrotrone TriesteItaly
  2. 2.Physics DepartmentUniversity of TriesteItaly

Bibliographic information

  • DOI https://doi.org/10.1007/978-94-011-5724-7
  • Copyright Information Kluwer Academic Publishers 1997
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-94-010-6414-9
  • Online ISBN 978-94-011-5724-7
  • Series Print ISSN 0168-132X
  • Buy this book on publisher's site
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