Ultimate Limits of Fabrication and Measurement

  • M. E. Welland
  • J. K. Gimzewski

Part of the NATO ASI Series book series (NSSE, volume 292)

Table of contents

  1. Front Matter
    Pages i-x
  2. Towards Molecular and Supramolecular Devices

    1. Jon A. Preece, J. Fraser Stoddart
      Pages 1-8
  3. Nanoscale Fabrication

    1. W. M. Tolles
      Pages 9-16
  4. Microminiaturization in Laser Surgery and in vivo Intradiscal Pressure Measurement in Intervertebral Discs

  5. Self Replicating Systems and Low Cost Manufacturing

  6. The Use of Actuation Principles for Micro Robots

    1. U. Rembold, S. Fatikow, TH. Dörsam, B. Magnussen
      Pages 33-40
  7. Biophysical Approach to Nano-Mental Engineering’s Limits

  8. IDEAS -Intelligent Design Environment for Algorithms and Systems

    1. Thomas Beth, Jörn Müller-Quade, Armin Nückel
      Pages 49-57
  9. Electron-Nucleus Interaction in a Finite Atomic Line Modulated by a Focussed Electric Field

  10. Electromagnetic Radiation in Nanostructures

  11. Using Atom Optics to Fabricate Nanostructures

    1. R. J. Celotta, J. J. McClelland, R. E. Scholten, R. Gupta
      Pages 75-78
  12. Limits to Squeezing of Quantum Fluctuations

    1. Arkadiusz Orłowski
      Pages 79-87
  13. Micromechanical Calorimeter with Picojoule-Sensitivity

    1. E. Meyer, J. K. Gimzewski, CH. Gerber, R. R. Schlittler
      Pages 89-95
  14. The Point-Contact Thermometer and Its Application in the Study of Hydrodynamic Electron Flow

  15. Noise in Scanning Tunneling Microscopy

    1. B. Koslowski, C. Baur, K. Dransfeld
      Pages 105-113
  16. A Nanosensor for Admittance Spectroscopy

    1. Lars Montelius, Jonas O. Tegenfeldt, Torbjörn G. I. Ling
      Pages 115-122
  17. Nanodeformation -Solid or Liquid?

    1. J. B. Pethica
      Pages 123-127
  18. Theory of Conduction through Quantum Necks

    1. J. A. Torres, J. J. Sáenz
      Pages 129-137
  19. A Scanning Force and Friction Microscope

    1. PH. Niedermann, J. Burger, M. Binggeli, R. Christoph, H. E. Hintermann, O. Marti
      Pages 139-145
  20. Electrical Properties of Nanometer-Size Metal-Semiconductor Point Contacts

    1. Y. Hasegawa, I.-W. Lyo, PH. Avouris
      Pages 147-154

About this book

Introduction

An extensive body of research is involved in pushing miniaturisation to its physical limit, encompassing the miniaturisation of electronic devices, the manipulation of single atoms by scanning tunnelling microscopy, bio-engineering, the chemical synthesis of complex molecules, microsensor technology, and information storage and retrieval. In parallel to these practical aspects of miniaturisation there is also the necessity to understand the physics of small structures.
Ultimate Limits of Fabrication and Measurement brings together a number of leading articles from a variety of fields with the common aim of ultimate miniaturisation and measurement.

Keywords

AES Laser PAS REM STEM STM Sensor

Editors and affiliations

  • M. E. Welland
    • 1
  • J. K. Gimzewski
    • 2
  1. 1.Department of EngineeringThe University of CambridgeCambridgeUK
  2. 2.IBM Research DivisionZurich Research LaboratoryRüschlikonSwitzerland

Bibliographic information

  • DOI https://doi.org/10.1007/978-94-011-0041-0
  • Copyright Information Kluwer Academic Publishers 1995
  • Publisher Name Springer, Dordrecht
  • eBook Packages Springer Book Archive
  • Print ISBN 978-94-010-4023-5
  • Online ISBN 978-94-011-0041-0
  • Series Print ISSN 0168-132X
  • About this book
Industry Sectors
Electronics
Chemical Manufacturing