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Photo-Excited Charge Collection Spectroscopy

Probing the traps in field-effect transistors

  • Seongil Im
  • Youn-Gyoung Chang
  • Jae Hoon Kim

Part of the SpringerBriefs in Physics book series (SpringerBriefs in Physics)

Table of contents

  1. Front Matter
    Pages i-xi
  2. Seongil Im, Youn-Gyoung Chang, Jae Kim
    Pages 1-16
  3. Seongil Im, Youn-Gyoung Chang, Jae Kim
    Pages 17-29
  4. Seongil Im, Youn-Gyoung Chang, Jae Kim
    Pages 31-58
  5. Seongil Im, Youn-Gyoung Chang, Jae Kim
    Pages 59-81
  6. Seongil Im, Youn-Gyoung Chang, Jae Kim
    Pages 83-97
  7. Seongil Im, Youn-Gyoung Chang, Jae Kim
    Pages 99-100
  8. Back Matter
    Pages 101-101

About this book

Introduction

Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps present at the channel/dielectric interface or in the thin-film channel itself.

This book contains how to characterize these traps, starting from the device physics of field-effect transistor (FET). Unlike conventional analysis techniques which are away from well-resolving spectral results, newly-introduced photo-excited charge-collection spectroscopy (PECCS) utilizes the photo-induced threshold voltage response from any type of working transistor devices with organic-, inorganic-, and even nano-channels, directly probing on the traps. So, our technique PECCS has been discussed through more than ten refereed-journal papers in the fields of device electronics, applied physics, applied chemistry, nano-devices and materials science, finally finding a need to be summarized with several chapters in a short book. Device physics and instrumentations of PECCS are well addressed respectively, in the first and second chapters, for the next chapters addressing real applications to organic, oxide, and nanostructured FETs. This book would provide benefits since its contents are not only educational and basic principle-supportive but also applicable and in-house operational.

Keywords

Deep-level transient Spectroscopy Field-effect Transistors (FETs) Nanowire-based FETs Organic field-effect Transistor PECCS Review Photo-Excited Charge Collection Spectroscopy Reviewed Photo-Excited Spectroscopy Photo-capacitive Spectroscopy Thin-film Transistors nanostructure-based FET oxide TFT

Authors and affiliations

  • Seongil Im
    • 1
  • Youn-Gyoung Chang
    • 2
  • Jae Hoon Kim
    • 3
  1. 1.Institute of Physics and Applied Physics, PhysicsYonsei UniversitySeoulKorea, Republic of (South Korea)
  2. 2., PhysicsYonsei UniversitySeoulKorea, Republic of (South Korea)
  3. 3., PhysicsYonsei UniversitySeoulKorea, Republic of (South Korea)

Bibliographic information

  • DOI https://doi.org/10.1007/978-94-007-6392-0
  • Copyright Information The Author(s) 2013
  • Publisher Name Springer, Dordrecht
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-94-007-6391-3
  • Online ISBN 978-94-007-6392-0
  • Series Print ISSN 2191-5423
  • Series Online ISSN 2191-5431
  • Buy this book on publisher's site
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