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From scientific instrument to industrial machine

Coping with architectural stress in embedded systems

  • Richard Doornbos
  • Sjir van Loo

Part of the SpringerBriefs in Electrical and Computer Engineering book series (BRIEFSELECTRIC)

Table of contents

  1. Front Matter
    Pages i-xii
  2. Introduction

    1. Front Matter
      Pages 1-1
    2. Front Matter
      Pages 103-103
    3. Front Matter
      Pages 51-51
    4. Front Matter
      Pages 7-7
    5. Richard Doornbos, Sjir van Loo
      Pages 3-6
  3. Architecture

    1. Richard Doornbos, Sjir van Loo
      Pages 9-19
    2. Richard Doornbos, Sjir van Loo
      Pages 21-42
    3. Richard Doornbos, Sjir van Loo
      Pages 43-50
  4. Automation and control functions

    1. Richard Doornbos, Sjir van Loo
      Pages 53-61
    2. Richard Doornbos, Sjir van Loo
      Pages 63-79
    3. Richard Doornbos, Sjir van Loo
      Pages 81-102
  5. Conclusion

    1. Richard Doornbos, Sjir van Loo
      Pages 105-108
  6. Back Matter
    Pages 109-112

About this book

Introduction

Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In From scientific instrument to industrial machine, we look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company. Traditionally, transmission electron microscopes are manually operated scientific instruments, but they also have enormous potential for use in industrial applications. However, this new market has quite different characteristics. There are strong demands for cost-effective analysis, accurate and precise measurements, and ease-of-use. These demands can be translated into new system qualities, e.g. reliability, predictability and high throughput, as well as new functions, e.g. automation of electron microscopic analyses, automated focusing and positioning functions.

From scientific instrument to industrial machine takes a pragmatic approach to the problem of architectural stress. In particular, it describes the outcomes of the Condor project, a joint endeavour by a consortium of industrial and academic partners. In this collaboration an integrated approach was essential to successfully combine various scientific results and show the first steps towards a new direction. System modelling and prototyping were the key techniques to develop better understanding and innovative solutions to the problems associated with architectural stress.

From scientific instrument to industrial machine is targeted mainly at industrial practitioners, in particular system architects and engineers working on high tech systems. It can therefore be read without particular knowledge of electron microscope systems or microscopic applications. The book forms a bridge between academic and applied science, and high tech industrial practice. By showing the approaches and solutions developed for the electron microscope, it is hoped that system designers will gain some insights in how to deal with architectural stress in similar challenges in the high tech industry.

Keywords

Electron Microscope Microprocessor design Systems Architecting Systems Engineering embedded systems architecture feasibility prototyping

Editors and affiliations

  • Richard Doornbos
    • 1
  • Sjir van Loo
    • 2
  1. 1.Embedded Systems InstituteEindhovenNetherlands
  2. 2., Senior Research FellowEmbedded Systems InstituteEindhovenNetherlands

Bibliographic information

  • DOI https://doi.org/10.1007/978-94-007-4147-8
  • Copyright Information The Author(s) 2012
  • Publisher Name Springer, Dordrecht
  • eBook Packages Engineering
  • Print ISBN 978-94-007-4146-1
  • Online ISBN 978-94-007-4147-8
  • Series Print ISSN 2191-8112
  • Series Online ISSN 2191-8120
  • Buy this book on publisher's site
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