Emerging Technologies and Circuits

  • Amara Amara
  • Thomas Ea
  • Marc Belleville

Part of the Lecture Notes in Electrical Engineering book series (LNEE, volume 66)

Table of contents

  1. Front Matter
    Pages i-ix
  2. Introduction

  3. Emerging Technologies and Circuits

    1. Front Matter
      Pages 15-15
    2. Victor V. Zhirnov, Ralph K. Cavin, George I. Bourianoff
      Pages 17-35
  4. Advanced Devices and Circuits

    1. Front Matter
      Pages 53-53
    2. N. Collaert, K. von Arnim, R. Rooyackers, T. Vandeweyer, A. Mercha, B. Parvais et al.
      Pages 55-66
    3. Kazuhiko Endo, Shin-ichi O’uchi, Yuki Ishikawa, Yongxun Liu, Takashi Matsukawa, Kunihiro Sakamoto et al.
      Pages 67-79
    4. Thuy Dao, Ik_Sung Lim, Larry Connell, Dina H. Triyoso, Youngbog Park, Charlie Mackenzie
      Pages 81-93
  5. Reliability and SEU

    1. Front Matter
      Pages 95-95
    2. Koji Eriguchi, Masayuki Kamei, Kenji Okada, Hiroaki Ohta, Kouichi Ono
      Pages 97-106
    3. Y. Nakakubo, A. Matsuda, M. Kamei, H. Ohta, K. Eriguchi, K. Ono
      Pages 107-120
  6. Power, Timing and Variability

    1. Front Matter
      Pages 121-121
    2. A. Siligaris, C. Mounet, B. Reig, P. Vincent, A. Michel
      Pages 123-130
    3. Olivier Thomas, Marc Belleville, Richard Ferrant
      Pages 131-139
    4. Keith A. Bowman, James W. Tschanz
      Pages 141-161
    5. Sean H. Wu, Alexander Tetelbaum, Li-C. Wang
      Pages 179-189
    6. Carmelo D’Agostino, Philippe Flatresse, Edith Beigne, Marc Belleville
      Pages 191-202

About this book

Introduction

With the semiconductor market growth, new Integrated Circuit designs are pushing the limit of the technology and in some cases, require specific fine-tuning of certain process modules in manufacturing. Thus the communities of design and technology are increasingly intertwined. The issues that require close interactions and collaboration for trade-off and optimization across the design/device/process fields are addressed in Emerging Technologies and Circuits. It contains a set of outstanding papers, keynote and tutorials presented during 3 days at the International Conference On Integrated Circuit Design and Technology (ICICDT) held in June 2008 in Minatec, Grenoble. The selected papers are spread over 5 chapters covering various aspects of emerging technologies and devices, advanced circuit design, reliability, variability issues and solutions, advanced memories and analog and mixed signals. All these papers are focusing on design and technology interactions and comply with the scope of the conference.

Keywords

CMOS FinFET Leistungsfeldeffekttransistor SRAM; advanced devices analog and mixed signal circuit design emerging technology field-effect transistor integrated circuit metal oxide semiconductur field-effect transistor reliability semiconductor

Editors and affiliations

  • Amara Amara
    • 1
  • Thomas Ea
    • 2
  • Marc Belleville
    • 3
  1. 1.Paris (ISEP)Institut Supérieur d’Electronique deParisFrance
  2. 2.Inst.Supérieur d’Electronique de ParisParisFrance
  3. 3.CEA-LETI MinatecGrenoble cedex 9France

Bibliographic information

  • DOI https://doi.org/10.1007/978-90-481-9379-0
  • Copyright Information Springer Science+Business Media B.V. 2010
  • Publisher Name Springer, Dordrecht
  • eBook Packages Engineering
  • Print ISBN 978-90-481-9378-3
  • Online ISBN 978-90-481-9379-0
  • Series Print ISSN 1876-1100
  • Series Online ISSN 1876-1119
  • About this book
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