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Table of contents (101 papers)
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Front Matter
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X-Ray Optics
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Electron Probe Microanalysis. Physical Bases
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Electron Probe Microanalysis. Quantitative Analysis
About this book
Editors and Affiliations
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Institut für angewandte Physik, Universität, 74 Tübingen, Germany
G. Möllenstedt, K. H. Gaukler
Bibliographic Information
Book Title: Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
Book Subtitle: Tübingen, September 9th–14th, 1968
Editors: G. Möllenstedt, K. H. Gaukler
DOI: https://doi.org/10.1007/978-3-662-12108-5
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 1969
Softcover ISBN: 978-3-662-12110-8Published: 20 November 2013
eBook ISBN: 978-3-662-12108-5Published: 29 June 2013
Edition Number: 1
Number of Pages: XII, 612
Number of Illustrations: 547 b/w illustrations, 1 illustrations in colour
Topics: Physics, general
Industry Sectors: Energy, Utilities & Environment, Engineering