Noise in Semiconductor Devices

Modeling and Simulation

  • Fabrizio Bonani
  • Giovanni Ghione

Part of the Springer Series in ADVANCED MICROELECTRONICS book series (MICROELECTR., volume 7)

Table of contents

  1. Front Matter
    Pages I-XXXI
  2. Fabrizio Bonani, Giovanni Ghione
    Pages 1-38
  3. Fabrizio Bonani, Giovanni Ghione
    Pages 39-76
  4. Fabrizio Bonani, Giovanni Ghione
    Pages 77-100
  5. Fabrizio Bonani, Giovanni Ghione
    Pages 101-141
  6. Fabrizio Bonani, Giovanni Ghione
    Pages 143-175
  7. Back Matter
    Pages 177-213

About this book

Introduction

The book presents a comprehensive treatment of the numerical simulation of semiconductor devices. After an overview of the basic physics of fluctuations in semiconductors, noise modelling techniques are introduced for the small-signal case. In particular, a detailed treatment is devoted to Green's function approaches such as the Impedance Field Method. Then, the numerical implementation of such approaches within the framework of multi-dimensional numerical device models is discussed in detail with reference to the customary Finite-Boxes discretization scheme. Finally, the topic of large-signal noise simulation is addressed within the framework of the Harmonic Balance approach, and implementation details are given for the non-autonomous case. The application fields covered range from low-noise, small-signal amplifiers to nonlinear circuits such as RF and microwave frequency multipliers and mixers.

Keywords

Semiconductor device numerical simultation integrated circuit noise in linear circuits noise in nonlinear circuits noise in semiconductors semiconductor devices

Authors and affiliations

  • Fabrizio Bonani
    • 1
  • Giovanni Ghione
    • 1
  1. 1.Dipartimento di ElettronicaPolitecnico di TorinoTorinoItaly

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-662-04530-5
  • Copyright Information Springer-Verlag Berlin Heidelberg 2001
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-08586-4
  • Online ISBN 978-3-662-04530-5
  • Series Print ISSN 1437-0387
  • About this book
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