Nanostructures and Quantum Effects

Proceedings of the JRDC International Symposium, Tsukuba, Japan, November 17–18, 1993

  • H. Sakaki
  • H. Noge

Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 31)

Table of contents

  1. Front Matter
    Pages I-XI
  2. Electron Waves, Holography, and Quantum Mechanics

    1. Front Matter
      Pages 1-1
    2. T. Hirayama, Q. Ru, J. Chen, T. Tanji, A. Tonomura
      Pages 13-16
    3. H.-W. Fink, H. Schmid
      Pages 17-27
    4. Y. Aharonov, L. Vaidman
      Pages 28-34
  3. Electron Transport 1: Low-Dimensional Effects

  4. Electron Transport 2: Single-Electron and Spin Effects

    1. Front Matter
      Pages 93-93
    2. L. P. Kouwenhoven, S. Jauhar, K. McCormick, D. Dixon, P. L. McEuen, Yu. V. Nazarov et al.
      Pages 95-106
    3. T. Sakamoto, S. W. Hwang, Y. Nakamura, K. Nakamura
      Pages 107-111

About these proceedings


Nanostructures and Quantum Effects documents the most recent developments in the field of quantum effects in semiconductor nanostructures such as quantum wires and boxes. Interrelated topics such as quantum interference, low-dimensional electron transport, single-electron and microcavity effects, electron holography, and quantum measurements together with the most recent progress in epitaxial growth of nanostructures and the manipulation of atoms using STM-related approaches are covered.


Quantum Nonostructures epitaxy exciton holography interference laser microscopy optical properties polarization scattering semiconductor silicon surface thin films transport

Authors and affiliations

  • H. Sakaki
    • 1
  • H. Noge
    • 2
  1. 1.Research Center for Advanced Science and TechnologyUniversity of TokyoMeguro-ku, Tokyo 153Japan
  2. 2.Quantum Wave ProjectJRDCMeguro-ku, Tokyo 153Japan

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 1994
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-79234-2
  • Online ISBN 978-3-642-79232-8
  • Series Print ISSN 0933-033X
  • Series Online ISSN 2196-2812
  • About this book
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