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Applied Scanning Probe Methods

  • Bharat Bhushan
  • Harald Fuchs
  • Sumio Hosaka

Part of the NanoScience and Technology book series (NANO)

Table of contents

  1. Front Matter
    Pages I-XX
  2. Scanning Probe Microscopy

    1. Front Matter
      Pages 1-1
    2. André Schirmeisen, Boris Anczykowski, Harald Fuchs
      Pages 3-39
    3. Volker Scherer, Michael Reinstädtler, Walter Arnold
      Pages 75-115
    4. Egbert Oesterschulze, Rainer Kassing
      Pages 117-146
    5. John S. Villarrubia
      Pages 147-168
  3. Characterization

    1. Front Matter
      Pages 169-169
    2. Jürgen Keller, Dietmar Vogel, Andreas Schubert, Bernd Michel
      Pages 253-276
    3. Ndubuisi G. Orji, Martha I. Sanchez, Jay Raja, Theodore V. Vorburger
      Pages 277-301
  4. Industrial Applications

  5. Back Matter
    Pages 469-476

About this book

Introduction

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.

Keywords

AFM Material Science Physical Chemistry ceramics chemistry microscopy modeling nanoscience nanotribology polymer surfaces

Authors and affiliations

  • Bharat Bhushan
    • 1
  • Harald Fuchs
    • 2
  • Sumio Hosaka
    • 3
  1. 1.Department of Mechanical EngineeringThe Ohio State UniversityColumbusUSA
  2. 2.Universität MünsterMünsterGermany
  3. 3.Dept. Electronic EngineeringGunma UniversityKiryu-CityJapan

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-35792-3
  • Copyright Information Springer-Verlag Berlin Heidelberg 2004
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-3-540-00527-8
  • Online ISBN 978-3-642-35792-3
  • Series Print ISSN 1434-4904
  • Series Online ISSN 2197-7127
  • Buy this book on publisher's site
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