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Structural, Syntactic, and Statistical Pattern Recognition

Joint IAPR International Workshop, SSPR&SPR 2012, Hiroshima, Japan, November 7-9, 2012. Proceedings

  • Georgy Gimel’farb
  • Edwin Hancock
  • Atsushi Imiya
  • Arjan Kuijper
  • Mineichi Kudo
  • Shinichiro Omachi
  • Terry Windeatt
  • Keiji Yamada

Part of the Lecture Notes in Computer Science book series (LNCS, volume 7626)

Table of contents

  1. Front Matter
  2. Pierre Devijver Award Lecture

  3. Invited Talks

  4. Structural, Syntactical, and Statistical Pattern Recognition

    1. Lin Han, Luca Rossi, Andrea Torsello, Richard C. Wilson, Edwin R. Hancock
      Pages 33-41
    2. Benoit Gaüzère, Luc Brun, Didier Villemin
      Pages 42-50
    3. Robert P. W. Duin, Ana L. N. Fred, Marco Loog, Elżbieta Pękalska
      Pages 51-59
    4. Zhouyu Fu, Guojun Lu, Kai-Ming Ting, Dengsheng Zhang
      Pages 60-69
  5. Graph and Tree Methods

    1. Lu Bai, Edwin R. Hancock
      Pages 79-88
    2. Xavier Cortés, Francesc Serratosa, Albert Solé-Ribalta
      Pages 98-106
    3. Nicola Rebagliati, Albert Solé-Ribalta, Marcello Pelillo, Francesc Serratosa
      Pages 107-115
  6. Randomized Methods and Image Analysis

    1. Silvio Jamil F. Guimarães, Jean Cousty, Yukiko Kenmochi, Laurent Najman
      Pages 116-125
    2. Martin Tschirsich, Arjan Kuijper
      Pages 126-134
    3. Jaume Gibert, Ernest Valveny, Horst Bunke, Alicia Fornés
      Pages 135-143
    4. Luca Rossi, Andrea Torsello, Edwin R. Hancock
      Pages 144-152
    5. Sergej Lewin, Xiaoyi Jiang, Achim Clausing
      Pages 153-161
  7. Kernel Methods in Structural and Syntactical Pattern Recognition

    1. Martin Tschirsich, Arjan Kuijper
      Pages 162-170
    2. Laura Antanas, Paolo Frasconi, Fabrizio Costa, Tinne Tuytelaars, Luc De Raedt
      Pages 171-180
    3. Lu Bai, Edwin R. Hancock, Peng Ren
      Pages 181-189
    4. Francisco Escolano, Boyan Bonev, Edwin R. Hancock
      Pages 190-198
    5. Sébastien Bougleux, François-Xavier Dupé, Luc Brun, Myriam Mokhtari
      Pages 199-207
  8. Applications of Structural and Syntactical Pattern Recognition

    1. Muhammad Haseeb, Edwin R. Hancock
      Pages 208-215
    2. Gulcan Can, Orhan Firat, Fatos Tunay Yarman Vural
      Pages 216-224
    3. Albert Solé-Ribalta, Xavier Cortés, Francesc Serratosa
      Pages 234-242
    4. Muhammad Muzzamil Luqman, Jean Yves Ramel, Josep Lladós
      Pages 243-253
  9. Clustering

    1. Pietro Lovato, Manuele Bicego
      Pages 273-281
    2. Chesner Désir, Simon Bernard, Caroline Petitjean, Laurent Heutte
      Pages 282-290
    3. Romain Quéré, Carl Frélicot
      Pages 291-300
  10. Learning

    1. Marco Loog, Robert P. W. Duin
      Pages 310-317
    2. Luis Romero-Ortega, Antonio Robles-Kelly
      Pages 318-326
    3. Bogdan Raducanu, Fadi Dornaika
      Pages 336-344
  11. Kernel Methods in Statistical Pattern Recognition

    1. Akira Tanaka, Ichigaku Takigawa, Hideyuki Imai, Mineichi Kudo
      Pages 345-353
    2. Song Liu, Makoto Yamada, Nigel Collier, Masashi Sugiyama
      Pages 363-372
    3. Furqan Aziz, Richard C. Wilson, Edwin R. Hancock
      Pages 382-390
  12. Applications of Statistical Pattern Recognition

    1. Mónica Millán-Giraldo, Vicente García, J. Salvador Sánchez
      Pages 391-399
    2. Lichi Zhang, Edwin R. Hancock, Jing Wu
      Pages 400-408
    3. Hitoshi Sakano, Tsukasa Ohashi, Akisato Kimura, Hiroshi Sawada, Katsuhiko Ishiguro
      Pages 409-416
    4. Battista Biggio, Giorgio Fumera, Fabio Roli, Luca Didaci
      Pages 417-425
    5. Karim T. Abou–Moustafa, Frank P. Ferrie
      Pages 426-436
  13. Applications of Structural, Syntactical, and Statistical Methods

    1. Francesc Serratosa, Xavier Cortés, Albert Solé-Ribalta
      Pages 437-447
    2. James Li, Abdullah Sonmez, Zehra Cataltepe, Eric Bax
      Pages 448-457

About these proceedings

Introduction

This volume constitutes the refereed proceedings of the Joint IAPR International Workshops on Structural and Syntactic Pattern Recognition (SSPR 2012) and Statistical Techniques in Pattern Recognition (SPR 2012), held in Hiroshima, Japan, in November 2012 as a satellite event of the 21st International Conference on Pattern Recognition, ICPR 2012.
The 80 revised full papers presented together with 1 invited paper and the Pierre Devijver award lecture were carefully reviewed and selected from more than 120 initial submissions. The papers are organized in topical sections on structural, syntactical, and statistical pattern recognition, graph and tree methods, randomized methods and image analysis, kernel methods in structural and syntactical pattern recognition, applications of structural and syntactical pattern recognition, clustering, learning, kernel methods in statistical pattern recognition, kernel methods in statistical pattern recognition, as well as applications of structural, syntactical, and statistical methods.

Keywords

collective classification genetic optimization kernel methods neural networks semantic parts

Editors and affiliations

  • Georgy Gimel’farb
    • 1
  • Edwin Hancock
    • 2
  • Atsushi Imiya
    • 3
  • Arjan Kuijper
    • 4
  • Mineichi Kudo
    • 5
  • Shinichiro Omachi
    • 6
  • Terry Windeatt
    • 7
  • Keiji Yamada
    • 8
  1. 1.Department of Computer ScienceUniversity of AucklandAucklandNew Zealand
  2. 2.Department of Computer ScienceUniversity of YorkYorkUK
  3. 3.Institute of Media and Information TechnologyChiba UniversityInage-kuJapan
  4. 4.Technische Universität/Fraunhofer IGDDarmstadtGermany
  5. 5.Graduate School of Information Science and TechnologyHokkaido UniversitySapporoJapan
  6. 6.Graduate School of EngineeringTohoku UniversitySendaiJapan
  7. 7.Centre for Vision, Speech and Signal ProcessingUniversity of SurreyGuildfordUK
  8. 8.C&C Innovation Research LaboratoriesNEC CorporationIkoma-ShiJapan

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-34166-3
  • Copyright Information Springer-Verlag Berlin Heidelberg 2012
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Computer Science
  • Print ISBN 978-3-642-34165-6
  • Online ISBN 978-3-642-34166-3
  • Series Print ISSN 0302-9743
  • Series Online ISSN 1611-3349
  • Buy this book on publisher's site
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