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  • © 2011

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

Editors:

  • Scientific status report on scanning probe techniques

  • Up-to-date information on the latest developments in scanning probe microscopy

  • Also important for NEMS and BioNEMS

  • Reference to researchers and graduate students in nanosciences

  • Includes supplementary material: sn.pub/extras

Part of the book series: NanoScience and Technology (NANO)

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  • ISBN: 978-3-642-10497-8
  • Instant PDF download
  • Readable on all devices
  • Own it forever
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  • Tax calculation will be finalised during checkout
Softcover Book USD 219.99
Price excludes VAT (USA)
Hardcover Book USD 299.99
Price excludes VAT (USA)

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Table of contents (25 chapters)

  1. Front Matter

    Pages i-xxvi
  2. Scanning Probe Microscopy Techniques

    1. Front Matter

      Pages 1-1
    2. Time-Resolved Tapping-Mode Atomic Force Microscopy

      • Ali Fatih Sarioglu, Olav Solgaard
      Pages 3-37
    3. Small Amplitude Atomic Force Spectroscopy

      • Sissi de Beer, Dirk van den Ende, Daniel Ebeling, Frieder Mugele
      Pages 39-58
    4. Combining Scanning Probe Microscopy and Transmission Electron Microscopy

      • Alexandra Nafari, Johan Angenete, Krister Svensson, Anke Sanz-Velasco, Håkan Olin
      Pages 59-99
    5. Near-Field Microwave Microscopy for Nanoscience and Nanotechnology

      • Kiejin Lee, Harutyun Melikyan, Arsen Babajanyan, Barry Friedman
      Pages 135-171
    6. Single Cluster AFM Manipulation: a Specialized Tool to Explore and Control Nanotribology Effects

      • Guido Paolicelli, Massimo Rovatti, Sergio Valeri
      Pages 173-194
  3. Characterization

    1. Front Matter

      Pages 195-195
    2. Biological Application of Fast-Scanning Atomic Force Microscopy

      • Yuki Suzuki, Masatoshi Yokokawa, Shige H. Yoshimura, Kunio Takeyasu
      Pages 217-246
    3. Transport Properties of Graphene with Nanoscale Lateral Resolution

      • Filippo Giannazzo, Vito Raineri, Emanuele Rimini
      Pages 247-285
    4. Semiconductors Studied by Cross-sectional Scanning Tunneling Microscopy

      • J. K. Garleff, J. M. Ulloa, P. M. Koenraad
      Pages 321-353
    5. Self-assembled Transition Metal Nanoparticles on Oxide Nanotemplates

      • Emanuele Cavaliere, Stefano Agnoli, Gaetano Granozzi, Luca Gavioli
      Pages 415-437

About this book

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Keywords

  • BioMEMS/NEMS
  • Biomimetics techinques
  • MEMS/NEMS
  • Nanotechnology and nanosciences
  • Scanning probe microscopy

Editors and Affiliations

  • Nanoprobe Lab. Bio- & Nanotechnology &, Biomimetics (NLB²), Ohio State University, Columbus, USA

    Bharat Bhushan

About the editor

Dr. Bharat Bhushan is an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Professor in the College of Engineering, and the Director of the Nanoprobe Laboratory for Bio- & Nanotechnology and Biomimetics (NLB2) at the Ohio State University, Columbus, Ohio. He holds two M.S., a Ph.D. in mechanical engineering/mechanics, an MBA, and three semi-honorary and honorary doctorates. His research interests include fundamental studies with a focus on scanning probe techniques in the interdisciplinary areas of bio/nanotribology, bio/nanomechanics and bio/nanomaterials characterization, and applications to bio/nanotechnology and biomimetics. He has authored 6 scientific books, more than 90 handbook chapters, more than 700 scientific papers (h factor – 42+), and more than 60 scientific reports, edited more than 45 books, and holds 17 U.S. and foreign patents. He is co-editor of Springer NanoScience and Technology Series and Microsystem Technologies. He has organized various international conferences and workshops. He is the recipient of numerous prestigious awards and international fellowships including the Alexander von Humboldt Research Prize for Senior Scientists, Max Planck Foundation Research Award for Outstanding Foreign Scientists, and the Fulbright Senior Scholar Award. He is a member of various professional societies, including the International Academy of Engineering (Russia). He has previously worked for various research labs including IBM Almaden Research Center, San Jose, CA. He has held visiting professor appointments at University of California at Berkeley, University of Cambridge, UK, Technical University Vienna, Austria, University of Paris, Orsay, ETH Zurich and EPFL Lausanne.

Bibliographic Information

Buying options

eBook USD 169.00
Price excludes VAT (USA)
  • ISBN: 978-3-642-10497-8
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book USD 219.99
Price excludes VAT (USA)
Hardcover Book USD 299.99
Price excludes VAT (USA)