New Horizons of Applied Scanning Electron Microscopy

  • Kenichi Shimizu
  • Tomoaki Mitani

Part of the Springer Series in Surface Sciences book series (SSSUR, volume 45)

Table of contents

  1. Front Matter
    Pages I-XIV
  2. Kenichi Shimizu, Tomoaki Mitani
    Pages 1-2
  3. Kenichi Shimizu, Tomoaki Mitani
    Pages 29-30
  4. Kenichi Shimizu, Tomoaki Mitani
    Pages 49-51
  5. Kenichi Shimizu, Tomoaki Mitani
    Pages 57-60

About this book


In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.


High-resolution SEM Metals and their structures SEM sample preparation Sample surface preparation Scanning electron microscopy alloy electron microscopy microscopy scanning electron microscope transmission electron microscopy

Authors and affiliations

  • Kenichi Shimizu
    • 1
  • Tomoaki Mitani
    • 2
  1. 1.University Chemical LaboratoryKeio UniversityYokohama, KanagawaJapan
  2. 2.Fac. Science & Technology, Central Facilities for ResearchKeio UniversityYokohama, KanagawaJapan

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 2010
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-3-642-03159-5
  • Online ISBN 978-3-642-03160-1
  • Series Print ISSN 0931-5195
  • About this book
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