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  • Book
  • © 2007

Roadmap of Scanning Probe Microscopy

Editors:

  • Predicting the future of scanning probe microscopy, this book will have a significant influence on the further development in the field.
  • Includes supplementary material: sn.pub/extras

Part of the book series: NanoScience and Technology (NANO)

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Table of contents (24 chapters)

  1. Front Matter

    Pages I-XVII
  2. Scanning Tunneling Microscopy

    • Masahiko Tomitori
    Pages 7-14
  3. Atomic Force Microscopy

    • Yasuhiro Sugawara
    Pages 15-21
  4. Near-Field Scanning Optical Microscope

    • Toshiharu Saiki
    Pages 23-33
  5. Scanning Capacitance Microscope

    • Yoshitsugu Nakagawa
    Pages 35-42
  6. Electrostatic Force Microscopy

    • Masakazu Nakamura, Hirofumi Yamada
    Pages 43-51
  7. Magnetic Force Microscope

    • Sumio Hosaka
    Pages 53-61
  8. STM-Induced Photon Emission Spectroscopy

    • Tooru Murashita
    Pages 63-70
  9. Scanning Atom Probe

    • Osamu Nishikawa
    Pages 71-76
  10. Chemical Discrimination of Atoms and Molecules

    • Komeda Tadahiro, Seizo Morita, Yauhiro Sugawara
    Pages 77-83
  11. Manipulation of Atoms and Molecules

    • Tadahiro Komeda, Seizo Morita, Shukichi Tanaka, Hirofumi Yamada
    Pages 85-94
  12. Multiprobe SPM

    • Shuji Hasegawa
    Pages 95-100
  13. AFM Measurement in Liquid

    • Hirofumi Yamada
    Pages 101-108
  14. High-Speed SPM

    • Toshio Ando
    Pages 109-116
  15. SPM Coupled with External Fields

    • Ken Nakajima, Tadahiro Komeda
    Pages 123-127
  16. Probe Technology

    • Masamichi Yoshimura
    Pages 129-132
  17. Characterization of Semiconducting Materials

    • Shuji Hasegawa, Masahiko Tomitori
    Pages 133-137
  18. Evaluation of SPM for LSI Devices

    • Koji Usuda, Takashi Furukawa, Yasushi Kadota
    Pages 139-150

About this book

Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surface science. Besides, atomic force microscopy is also rapidly developing and achieving remarkable progress and accomplishments such as true atomic resolution, atom/molecule identification, manipulation and nanostructuring. This book that predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately to be taken and to accelerate research and development on nanotechnology and nanoscience, as well as all SPM-related fields in future.

Reviews

From the reviews:

"This book results from a Japanese project aiming to predict the future development of SPM techniques and their potential applications out to the year 2020. … The descriptions and historical backgrounds for each technique are adequately written … . it will most likely find a use as a reference text and starting point for further reading." (N J Curson, Australian Physics, Vol. 44 (2), 2007)

Editors and Affiliations

  • Department of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, Suita, Japan

    Seizo Morita

Bibliographic Information

Buy it now

Buying options

eBook USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access