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  • Book
  • © 2018

Physical Design and Mask Synthesis for Directed Self-Assembly Lithography

  • Introduces a highly promising patterning solution for next generation technology
  • Provides a comprehensive overview of directed self-assembly lithography (DSAL) friendly physical design and DSAL-aware mask synthesis
  • Written by leading developers of this technology

Part of the book series: NanoScience and Technology (NANO)

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Table of contents (10 chapters)

  1. Front Matter

    Pages i-xiv
  2. Introduction

    • Seongbo Shim, Youngsoo Shin
    Pages 1-12
  3. Physical Design Optimizations

    1. Front Matter

      Pages 13-13
    2. DSAL Manufacturability

      • Seongbo Shim, Youngsoo Shin
      Pages 15-24
    3. Placement Optimization for DSAL

      • Seongbo Shim, Youngsoo Shin
      Pages 25-39
    4. Post-Placement Optimization for MP-DSAL Compliant Layout

      • Seongbo Shim, Youngsoo Shin
      Pages 41-50
    5. Redundant Via Insertion for DSAL

      • Seongbo Shim, Youngsoo Shin
      Pages 51-61
    6. Redundant Via Insertion for MP-DSAL

      • Seongbo Shim, Youngsoo Shin
      Pages 63-73
  4. Mask Synthesis and Optimizations

    1. Front Matter

      Pages 75-75
    2. DSAL Mask Synthesis

      • Seongbo Shim, Youngsoo Shin
      Pages 77-92
    3. Verification of Guide Patterns

      • Seongbo Shim, Youngsoo Shin
      Pages 93-115
    4. Cut Optimization

      • Seongbo Shim, Youngsoo Shin
      Pages 117-130
    5. Summary of The Book

      • Seongbo Shim, Youngsoo Shin
      Pages 131-133
  5. Back Matter

    Pages 135-138

About this book

This book discusses physical design and mask synthesis of directed self-assembly lithography (DSAL). It covers the basic background of DSAL technology, physical design optimizations such as placement and redundant via insertion, and DSAL mask synthesis as well as its verification. Directed self-assembly lithography (DSAL) is a highly promising patterning solution in sub-7nm technology.

Authors and Affiliations

  • Samsung Electronics, Hwasung, Korea (Republic of)

    Seongbo Shim

  • KAIST, Daejeon, Korea (Republic of)

    Youngsoo Shin

About the authors

Seongbo Shim received B.S. and M.S. degrees in physics from Seoul National University, Korea, in 2004 and 2006 respectively, and a Ph.D. in electrical engineering from KAIST, Korea, in 2016. From 2006 to 2012, he was with the Semiconductor R&D Center, Samsung Electronics, where he was a Senior Engineer working on photolithography, computational lithography, optical proximity correction (OPC), and design for manufacturability (DFM) for advanced technologies. He has authored more than 40 papers on lithography, OPC, and DFM. He is the holder of 15 patents. His research interests include mask synthesis algorithms, VLSI CAD for the design-manufacturing interface, design technology co-optimization (DTCO) for emerging technologies, and machine learning for lithography optimizations.

Youngsoo Shin received B.S., M.S., and Ph.D. degrees in Electronics Engineering from Seoul National University, Korea. From 2001 to 2004, he was a Research Staff Member at the IBM T. J. Watson Research Center, Yorktown Heights, NY, USA. In 2004, he joined the Department of Electrical Engineering, KAIST, Korea, where he is currently a professor. He has served as a Program Chair of ICCD in 2014 and VLSI-SoC in 2015, and as a General Chair of ASP-DAC in 2018. He is an associate editor of IEEE Transactions on CAD and IEEE Design and Test. He is an IEEE Fellow.

Bibliographic Information

Buy it now

Buying options

eBook USD 84.99
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book USD 109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access