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Kelvin Probe Force Microscopy

From Single Charge Detection to Device Characterization

  • Sascha Sadewasser
  • Thilo Glatzel

Part of the Springer Series in Surface Sciences book series (SSSUR, volume 65)

Table of contents

  1. Front Matter
    Pages i-xxiv
  2. Experimental Methods and Technical Aspects

    1. Front Matter
      Pages 1-1
    2. Sascha Sadewasser, Thilo Glatzel
      Pages 3-22
    3. Yoichi Miyahara, Peter Grütter
      Pages 23-47
    4. Stephen Jesse, Liam Collins, Sabine Neumayer, Suhas Somnath, Sergei V. Kalinin
      Pages 49-99
    5. Kei Kobayashi, Hirofumi Yamada
      Pages 101-118
    6. Sascha Sadewasser, Nicoleta Nicoara
      Pages 119-143
  3. Data Interpretation and Theoretical Aspects

    1. Front Matter
      Pages 145-145
    2. Philipp Rahe, Hagen Söngen
      Pages 147-170
    3. Hagen Söngen, Philipp Rahe, Ralf Bechstein, Angelika Kühnle
      Pages 171-200
    4. Leo Polak, Rinke J. Wijngaarden
      Pages 227-247
  4. Application to Device Characterization

    1. Front Matter
      Pages 249-249
    2. Evgheni Strelcov, Mahshid Ahmadi, Sergei V. Kalinin
      Pages 251-329
    3. Alex Henning, Yossi Rosenwaks
      Pages 367-389
    4. Liam Collins, Stefan A.L. Weber, Brian J. Rodriguez
      Pages 391-433
  5. Atomic Scale Experiments

    1. Front Matter
      Pages 435-435
    2. Yan Jun Li, Haunfei Wen, Zong Min Ma, Lili Kou, Yoshitaka Naitoh, Yasuhiro Sugawara
      Pages 437-463
    3. Michael Ellner, Pablo Pou, Ruben Perez
      Pages 465-497
    4. Martin Ondráček, Prokop Hapala, Martin Švec, Pavel Jelínek
      Pages 499-518
  6. Back Matter
    Pages 519-521

About this book

Introduction

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.

In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics.

It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.


Keywords

Scanning Kelvin Probe Microscopy Electrostatic Force Microscopy KPFM techniques for liquid environment KPFM with atomic resolution KPFM with atomic resolution electrostatic field of a cantilever Kelvin spectroscopy of single molecules

Editors and affiliations

  • Sascha Sadewasser
    • 1
  • Thilo Glatzel
    • 2
  1. 1.International Iberian Nanotechnology LaboratoryBragaPortugal
  2. 2.Department of PhysicsUniversity of BaselBaselSwitzerland

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-75687-5
  • Copyright Information Springer International Publishing AG, part of Springer Nature 2018
  • Publisher Name Springer, Cham
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-319-75686-8
  • Online ISBN 978-3-319-75687-5
  • Series Print ISSN 0931-5195
  • Series Online ISSN 2198-4743
  • Buy this book on publisher's site
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