Overview
- Includes supplementary material: sn.pub/extras
Part of the book series: Conference Proceedings of the Society for Experimental Mechanics Series (CPSEMS)
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Table of contents (42 papers)
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Front Matter
Keywords
About this book
Advancement of Optical Methods in Experimental Mechanics, Volume 3 of the Proceedings of the 2016 SEM Annual Conference & Exposition on Experimental and Applied Mechanics, the third volume of ten from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on a wide range of optical methods ranging from traditional photoelasticity and interferometry to more recent DIC and DVC techniques, and includes papers in the following general technical research areas:
- Advances in Digital Image Correlation
- Challenging Applications of DIC
- Uncertainty Analysis & Improvements to DIC Accuracy
- Photoelasticity, Interferometry, & Moire Methods
- Applications of Stereovision
- Inverse Methods at High Strain Rates
- Inverse Methods in Plasticity
Editors and Affiliations
About the editors
Bibliographic Information
Book Title: Advancement of Optical Methods in Experimental Mechanics, Volume 3
Book Subtitle: Proceedings of the 2016 Annual Conference on Experimental and Applied Mechanics 
Editors: Sanichiro Yoshida, Luciano Lamberti, Cesar Sciammarella
Series Title: Conference Proceedings of the Society for Experimental Mechanics Series
DOI: https://doi.org/10.1007/978-3-319-41600-7
Publisher: Springer Cham
eBook Packages: Engineering, Engineering (R0)
Copyright Information: The Society for Experimental Mechanics, Inc. 2017
Hardcover ISBN: 978-3-319-41599-4Published: 08 September 2016
Softcover ISBN: 978-3-319-82393-5Published: 22 April 2018
eBook ISBN: 978-3-319-41600-7Published: 07 September 2016
Series ISSN: 2191-5644
Series E-ISSN: 2191-5652
Edition Number: 1
Number of Pages: XV, 341
Number of Illustrations: 82 b/w illustrations, 241 illustrations in colour
Topics: Theoretical and Applied Mechanics, Optical and Electronic Materials, Characterization and Evaluation of Materials
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