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Fracture, Fatigue, Failure and Damage Evolution, Volume 8

Proceedings of the 2015 Annual Conference on Experimental and Applied Mechanics

  • Allison M. Beese
  • Alan T. Zehnder
  • Shuman Xia

Table of contents

  1. Front Matter
    Pages i-viii
  2. J. C. Moller, S. A. Barr, T. D. Breitzman, G. S. Kedziora, A. M. Ecker, R. J. Berry et al.
    Pages 17-25
  3. Takahiro Ozaki, Tatsuro Kosaka, Kazuhiro Kusukawa
    Pages 27-33
  4. Sharlotte Kramer, John Laing, Thomas Bosiljevec, Jhana Gearhart, Brad Boyce
    Pages 51-60
  5. J. P. M. Hoefnagels, C. Du, T. W. J. de Geus, R. H. J. Peerlings, M. G. D. Geers
    Pages 61-65
  6. Anahita Imanian, Mohammad Modarres
    Pages 73-81
  7. Addis Tessema, Dan Zhao, Addis Kidane, Sanat K. Kumar
    Pages 89-94
  8. M. Khandaker, Y. Li, P. Snow, S. Riahinezhad, K. Foran
    Pages 95-103
  9. D. V. Nelson, Z. Long
    Pages 105-114
  10. Mahdi Kiani, Rayford Forest, Steven Tipton, Michael W. Keller
    Pages 115-123
  11. Mahdi Kiani, Steven Tipton, Michael W. Keller
    Pages 125-133
  12. Sanichiro Yoshida, Tomohiro Sasaki
    Pages 141-149
  13. Chun-Jen Hsueh, Guruswami Ravichandran, Kaushik Bhattacharya
    Pages 151-155
  14. Kenneth Perry, Alex Teiche, Izak McGieson
    Pages 157-164
  15. O. Borla, G. Lacidogna, E. Di Battista, M. Costantino, A. Carpinteri
    Pages 165-173
  16. A. Manuello, R. Malvano, O. Borla, A. Palumbo, A. Carpinteri
    Pages 175-182
  17. P. C. F. Di Stefano, C. Bouard, S. Ciliberto, S. Deschanel, O. Ramos, S. Santucci et al.
    Pages 183-186
  18. A. Carpinteri, O. Borla, A. Goi, S. Guastella, A. Manuello, R. Sesana et al.
    Pages 187-195
  19. Joseph D. Schaefer, Isaac M. Daniel
    Pages 197-208
  20. Torin Quick, Sirina Safriet, David Mollenhauer, Chad Ryther, Robert Wheeler
    Pages 225-233
  21. Nicolas Angellier, Rostand Moutou Pitti, Frédéric Dubois
    Pages 235-242
  22. Rostand Moutou Pitti, Seif Eddine Hamdi, Frédéric Dubois, Hassen Riahi, Nicolas Angelier
    Pages 243-251
  23. Shawoon K. Roy, Michael Peña, Robert S. Hixson, Mohamed Trabia, Brendan O’Toole, Steven Becker et al.
    Pages 253-260
  24. Anton Khomenko, Ermias G. Koricho, Mahmoodul Haq, Gary L. Cloud
    Pages 261-267
  25. Ermias G. Koricho, Anton Khomenko, Mahmoodul Haq, Gary L. Cloud
    Pages 269-276

About these proceedings

Introduction

Fracture, Fatigue, Failure and Damage Evolution, Volume 8 represents the eighth of nine volumes of technical papers presented at the Society for Experimental Mechanics (SEM) 15th International Congress & Exposition on Experimental and Applied Mechanics, held at Costa Mesa, California, June 8-11, 2015.. The full set of proceedings also includes volumes on: Dynamic Behavior of Materials, Challenges in Mechanics of Time Dependent Materials, Advancement of Optical Methods in Experimental Mechanics, Experimental and Applied Mechanics, 16th International Symposium on MEMS and Nanotechnology,  International Symposium on the Mechanics of Composite and Multi-functional Materials,  5th International Symposium on the Mechanics of Biological Systems and Materials, International Symposium on the Mechanics of Composite and Multi-functional Materials; and Residual Stress,  Thermomechanics & Infrared Imaging, Hybrid Techniques and Inverse Problems.

Keywords

Computational Modeling of Fatigue and Fracture Conf. Pro. of the Society for Experimental Mechanics Fracture Mechanics Low Impedance Materials Materials failure Materials fatigue

Editors and affiliations

  • Allison M. Beese
    • 1
  • Alan T. Zehnder
    • 2
  • Shuman Xia
    • 3
  1. 1.Materials Engineering departmentPennsylvania State UniversityPennsylvaniaUSA
  2. 2.Cornell UniversityIthacaUSA
  3. 3.Georgia Institute of TechnologyAtlantaUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-21611-9
  • Copyright Information The Society for Experimental Mechanics, Inc. 2016
  • Publisher Name Springer, Cham
  • eBook Packages Engineering
  • Print ISBN 978-3-319-21610-2
  • Online ISBN 978-3-319-21611-9
  • Series Print ISSN 2191-5644
  • Series Online ISSN 2191-5652
  • Buy this book on publisher's site
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