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Debug Automation from Pre-Silicon to Post-Silicon

  • Mehdi Dehbashi
  • Görschwin Fey

Table of contents

  1. Front Matter
    Pages i-xiv
  2. Mehdi Dehbashi, Görschwin Fey
    Pages 1-8
  3. Mehdi Dehbashi, Görschwin Fey
    Pages 9-24
  4. Debug of Design Bugs

    1. Front Matter
      Pages 25-25
    2. Mehdi Dehbashi, Görschwin Fey
      Pages 27-48
    3. Mehdi Dehbashi, Görschwin Fey
      Pages 49-62
    4. Mehdi Dehbashi, Görschwin Fey
      Pages 63-76
  5. Debug of Delay Faults

    1. Front Matter
      Pages 77-77
    2. Mehdi Dehbashi, Görschwin Fey
      Pages 79-99
    3. Mehdi Dehbashi, Görschwin Fey
      Pages 101-114
    4. Mehdi Dehbashi, Görschwin Fey
      Pages 115-129
  6. Debug of Transactions

    1. Front Matter
      Pages 131-131
    2. Mehdi Dehbashi, Görschwin Fey
      Pages 133-157
    3. Mehdi Dehbashi, Görschwin Fey
      Pages 159-160
  7. Back Matter
    Pages 161-171

About this book

Introduction

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.

  • Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages;
  • Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;
  • Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.

Keywords

Automated Debugging from Pre-Silicon to Post-Silicon Debug Automation Debug Infrastructure Debugging Embedded Microprocessor Systems Debugging at the Electronic System Level Gate-level Debugging RTL Debugging Transaction-level Debugging

Authors and affiliations

  • Mehdi Dehbashi
    • 1
  • Görschwin Fey
    • 2
  1. 1.Institute of Computer ScienceUniversity of BremenBremenGermany
  2. 2.Institute of Space SystemsGerman Aerospace CenterBremenGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-319-09309-3
  • Copyright Information Springer International Publishing Switzerland 2015
  • Publisher Name Springer, Cham
  • eBook Packages Engineering
  • Print ISBN 978-3-319-09308-6
  • Online ISBN 978-3-319-09309-3
  • Buy this book on publisher's site
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