Transmission Electron Microscopy

1. Diffraction

   1. Indexing Diffraction Patterns

      • David B. Williams, C. Barry Carter

      Pages 265-287

   2. Kikuchi Diffraction

      • David B. Williams, C. Barry Carter

      Pages 289-299

   3. Obtaining CBED Patterns

      • David B. Williams, C. Barry Carter

      Pages 301-318

   4. Using Convergent-Beam Techniques

      • David B. Williams, C. Barry Carter

      Pages 319-345

2. Imaging

   1. Front Matter

      Pages 347-347

      PDF

   2. Imaging in the TEM

      • David B. Williams, C. Barry Carter

      Pages 349-366

   3. Thickness and Bending Effects

      • David B. Williams, C. Barry Carter

      Pages 367-378

   4. Planar Defects

      • David B. Williams, C. Barry Carter

      Pages 379-399

   5. Strain Fields

      • David B. Williams, C. Barry Carter

      Pages 401-420

   6. Weak-Beam Dark-Field Microscopy

      • David B. Williams, C. Barry Carter

      Pages 421-438

   7. Phase-Contrast Images

      • David B. Williams, C. Barry Carter

      Pages 439-455

   8. High-Resolution TEM

      • David B. Williams, C. Barry Carter

      Pages 457-482

   9. Image Simulation

      • David B. Williams, C. Barry Carter

      Pages 483-498

   10. Quantifying and Processing HRTEM Images

       • David B. Williams, C. Barry Carter

       Pages 499-527

   11. Other Imaging Techniques

       • David B. Williams, C. Barry Carter

       Pages 529-549

3. Spectrometry

   1. Front Matter

      Pages 551-551

      PDF

   2. X-ray Spectrometry

      • David B. Williams, C. Barry Carter

      Pages 553-572

   3. The XEDS-TEM Interface

      • David B. Williams, C. Barry Carter

      Pages 573-585

   4. Qualitative X-ray Analysis

      • David B. Williams, C. Barry Carter

      Pages 587-595

   5. Quantitative X-ray Microanalysis

      • David B. Williams, C. Barry Carter

      Pages 597-620

Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi­ of materials by completing the processing-structure-prop­ croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them­ to achieve specific sets of properties; the extraordinary abili­ selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM­ of all of these areas before one can hope to tackle signifi­ instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate­ be used with care and attention, in many cases involving rials education must include suitable courses in electron mi­ teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci­ for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

• Helium-Atom-Streuung
• crystal
• diffraction
• electron microscope
• electron microscopy
• materials characterization
• microscopy
• transmission electron microscopy
• Biological Microscopy

`The best textbook for this audience available.'
American Scientist, January-February 1998
`Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course.'
Microscope
`This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.'
Micron
`The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clearcut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.'
MRS Bulletin, May 1998
`The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.'
from the Foreword by Professor Gareth Thomas, University of California, Berkeley

• Lehigh University, Bethlehem, USA

  David B. Williams

• University of Minnesota, Minneapolis, USA

  C. Barry Carter

Policies and ethics