Skip to main content
Book cover

EXAFS Spectroscopy

Techniques and Applications

  • Book
  • © 1981

Overview

This is a preview of subscription content, log in via an institution to check access.

Access this book

eBook USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

Licence this eBook for your library

Institutional subscriptions

Table of contents (21 chapters)

Keywords

About this book

This book on Extended X-Ray Absorption Fine Structure (EXAFS) Spectroscopy grew out of a symposium, with the same title, organized by us at the 1979 Meeting of the Materials Research Society (MRS) in Boston, MA. That meeting provided not only an overview of the theory, instrumentation and practice of EXAFS Spectroscopy as currently employed with photon beams, but also a forum for a valuable dialogue between those using the conventional approach and those breaking fresh ground by using electron energy loss spectroscopy (EELS) for EXAFS studies. This book contains contributions from both of these groups and provides the interested reader with a detailed treatment of all aspects of EXAFS spectroscopy, from the theory, through consideration of the instrumentation for both photon and electron beam purposes, to detailed descriptions of the applications and physical limitations of these techniques. While some of the material was originally presented at the MRS meeting all of the chapters have been specially written for this book and contain much that is new and significant.

Editors and Affiliations

  • Bell Laboratories, Murray Hill, USA

    B. K. Teo, D. C. Joy

Bibliographic Information

Publish with us