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Table of contents (31 chapters)
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Front Matter
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Yield Models for Defect-Tolerant Vlsi Circuits: A Review
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Wafer Scale Revisited
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Defect Monitoring and Yield Projection
About this book
Editors and Affiliations
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University of Massachusetts, Amherst, USA
Israel Koren
Bibliographic Information
Book Title: Defect and Fault Tolerance in VLSI Systems
Book Subtitle: Volume 1
Editors: Israel Koren
DOI: https://doi.org/10.1007/978-1-4615-6799-8
Publisher: Springer New York, NY
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eBook Packages: Springer Book Archive
Copyright Information: Springer Science+Business Media New York 1989
Softcover ISBN: 978-1-4615-6801-8Published: 12 June 2012
eBook ISBN: 978-1-4615-6799-8Published: 06 December 2012
Edition Number: 1
Number of Pages: XII, 362
Number of Illustrations: 96 b/w illustrations
Topics: Logics and Meanings of Programs
Industry Sectors: Aerospace, Electronics, IT & Software, Telecommunications