Nyquist AD Converters, Sensor Interfaces, and Robustness

Advances in Analog Circuit Design, 2012

  • Arthur H.M. van Roermund
  • Andrea Baschirotto
  • Michiel Steyaert

Table of contents

  1. Front Matter
    Pages i-x
  2. Nyquist AD Converters

    1. Front Matter
      Pages 1-2
    2. Jan Mulder, Davide Vecchi, Frank M. L. van der Goes, Jan R. Westra, Emre Ayranci, Christopher M. Ward et al.
      Pages 13-30
    3. Pieter Harpe, Ming Ding, Ben Büsze, Cui Zhou, Kathleen Philips, Harmke de Groot
      Pages 31-49
    4. Erwin Janssen, Athon Zanikopoulos, Kostas Doris, Claudio Nani, Gerard van der Weide
      Pages 51-71
    5. Jieh-Tsorng Wu, Chun-Cheng Huang, Chung-Yi Wang
      Pages 73-96
    6. Yuriy M. Greshishchev
      Pages 97-114
  3. Sensor Interfaces

    1. Front Matter
      Pages 115-115
    2. Benedetto Vigna, E. Lasalandra, T. Ungaretti
      Pages 117-127
    3. Michiel A. P. Pertijs, Zhichao Tan
      Pages 129-147
    4. Piero Malcovati, Marco Grassi, Andrea Baschirotto
      Pages 149-174
  4. Robustness

    1. Front Matter
      Pages 201-201
    2. Erik H. M. Heijne
      Pages 203-221
    3. Ying Cao, Paul Leroux, Wouter De Cock, Michiel Steyaert
      Pages 223-243
    4. Marcel Pelgrom, Hans Tuinhout, Maarten Vertregt
      Pages 245-267
    5. Hagen Marien, Michiel Steyaert, Erik van Veenendaal, Paul Heremans
      Pages 269-279

About this book

Introduction

This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design.  Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity.  This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development. 

  • Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia;
  • Presents material in a tutorial-based format;
  • Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.

Keywords

Analog Circuit Design Analog to Digital Converters CMOS ADCs CMOS Connectivity CMOS Reliability CMOS Variability Capacitive Sensor Interfaces Nyquist A/D Converters

Editors and affiliations

  • Arthur H.M. van Roermund
    • 1
  • Andrea Baschirotto
    • 2
  • Michiel Steyaert
    • 3
  1. 1., Electrical EngineeringEindhoven University of TechnologyEindhovenNetherlands
  2. 2., Department of PhysicsUniversity of Milan-BicoccaMilanItaly
  3. 3., Dept. ElektrotechniekK.U.LeuvenHEVERLEEBelgium

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4614-4587-6
  • Copyright Information Springer Science+Business Media New York 2013
  • Publisher Name Springer, New York, NY
  • eBook Packages Engineering
  • Print ISBN 978-1-4614-4586-9
  • Online ISBN 978-1-4614-4587-6
  • About this book
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