Compact Models and Measurement Techniques for High-Speed Interconnects

  • Rohit Sharma
  • Tapas Chakravarty

Part of the SpringerBriefs in Electrical and Computer Engineering book series (BRIEFSELECTRIC)

Table of contents

  1. Front Matter
    Pages i-xviii
  2. Rohit Sharma, Tapas Chakravarty
    Pages 1-13
  3. Rohit Sharma, Tapas Chakravarty
    Pages 15-31
  4. Rohit Sharma, Tapas Chakravarty
    Pages 33-55
  5. Rohit Sharma, Tapas Chakravarty
    Pages 57-69

About this book

Introduction

Compact Models and Measurement Techniques for High-Speed Interconnects provides detailed analysis of issues related to high-speed interconnects from the perspective of modeling approaches and measurement techniques. Particular focus is laid on the unified approach (variational method combined with the transverse transmission line technique) to develop efficient compact models for planar interconnects. This book will give a qualitative summary of the various reported modeling techniques and approaches and will help researchers and graduate students with deeper insights into interconnect models in particular and interconnect in general. Time domain and frequency domain measurement techniques and simulation methodology are also explained in this book.

Keywords

Digital signal integrity High-speed interconnects Interconnect and microstrip design Interconnect geometry Interconnect modeling Interconnect theory VLSI design

Authors and affiliations

  • Rohit Sharma
    • 1
  • Tapas Chakravarty
    • 2
  1. 1., Interconnect Focus CenterGeorgia Institute of TechnologyAtlantaUSA
  2. 2.Tata Consultancy ServicesKolkataIndia

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4614-1071-3
  • Copyright Information The Author(s) 2012
  • Publisher Name Springer, Boston, MA
  • eBook Packages Engineering
  • Print ISBN 978-1-4614-1070-6
  • Online ISBN 978-1-4614-1071-3
  • About this book
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