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Residual Stress

Measurement by Diffraction and Interpretation

  • Book
  • © 1987

Overview

Authors:
  1. Ismail C. Noyan

    1. Thomas J. Watson Research Center, IBM, Yorktown Heights, USA

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    You can also search for this author in PubMed   Google Scholar

  2. Jerome B. Cohen

    1. Dept. of Materials Science and Engineering, The Technological Institute, Northwestern University, Evanston, USA

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    You can also search for this author in PubMed   Google Scholar

Part of the book series: Materials Research and Engineering (MATERIALS)

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Table of contents (8 chapters)

  1. Front Matter

    Pages I-X
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  2. Introduction

    • Ismail C. Noyan, Jerome B. Cohen
    Pages 1-12

  3. Fundamental Concepts in Stress Analysis

    • Ismail C. Noyan, Jerome B. Cohen
    Pages 13-46

  4. Analysis of Residual Stress Fields Using Linear Elasticity Theory

    • Ismail C. Noyan, Jerome B. Cohen
    Pages 47-74

  5. Fundamental Concepts in X-ray Diffraction

    • Ismail C. Noyan, Jerome B. Cohen
    Pages 75-116

  6. Determination of Strain and Stress Fields by Diffraction Methods

    • Ismail C. Noyan, Jerome B. Cohen
    Pages 117-163

  7. Experimental Errors Associated with the X-ray Measurement of Residual Stress

    • Ismail C. Noyan, Jerome B. Cohen
    Pages 164-210

  8. The Practical Use of X-ray Techniques

    • Ismail C. Noyan, Jerome B. Cohen
    Pages 211-229

  9. The Shape of Diffraction Peaks — X-ray Line Broadening

    • Ismail C. Noyan, Jerome B. Cohen
    Pages 230-247

  10. Back Matter

    Pages 248-276
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Keywords

Authors and Affiliations

  • Thomas J. Watson Research Center, IBM, Yorktown Heights, USA

    Ismail C. Noyan

  • Dept. of Materials Science and Engineering, The Technological Institute, Northwestern University, Evanston, USA

    Jerome B. Cohen

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