Authors:
- Describes the state of the art in the areas of radiation tolerance circuit design and process variation tolerant circuit design
- Presents analytical approaches to test efficiently the severity of electrical effects of radiation/process variations, as well as techniques to minimize the effects due to these two problems
- Distills content oriented toward nuclear engineers into leading-edge algorithms and techniques that can be understood easily and applied by VLSI designers
- Includes supplementary material: sn.pub/extras
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Table of contents (11 chapters)
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Front Matter
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Soft Errors
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Front Matter
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Back Matter
About this book
Authors and Affiliations
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Hillsboro, U.S.A.
Rajesh Garg
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Dept. Electrical & Computer Engineering, Texas A & M University, College Station, U.S.A.
Sunil P. Khatri
Bibliographic Information
Book Title: Analysis and Design of Resilient VLSI Circuits
Book Subtitle: Mitigating Soft Errors and Process Variations
Authors: Rajesh Garg, Sunil P. Khatri
DOI: https://doi.org/10.1007/978-1-4419-0931-2
Publisher: Springer New York, NY
eBook Packages: Engineering, Engineering (R0)
Copyright Information: Springer-Verlag US 2010
Hardcover ISBN: 978-1-4419-0930-5Published: 16 November 2009
Softcover ISBN: 978-1-4899-8510-1Published: 28 November 2014
eBook ISBN: 978-1-4419-0931-2Published: 22 October 2009
Edition Number: 1
Number of Pages: XXII, 212
Topics: Circuits and Systems, Computer-Aided Engineering (CAD, CAE) and Design
Industry Sectors: Aerospace, Automotive, Electronics, Energy, Utilities & Environment, Engineering, IT & Software, Oil, Gas & Geosciences, Telecommunications