Analysis and Design of Resilient VLSI Circuits

1. Front Matter

   Pages 1-18

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2. Introduction

   • Rajesh Garg, Sunil P. Khatri

   Pages 1-17

3. Soft Errors

   1. Front Matter

      Pages 20-20

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   2. Analytical Determination of Radiation-induced Pulse Width in Combinational Circuits

      • Rajesh Garg, Sunil P. Khatri

      Pages 21-40

   3. Analytical Determination of the Radiation-induced Pulse Shape

      • Rajesh Garg, Sunil P. Khatri

      Pages 41-58

   4. Modeling Dynamic Stability of SRAMs in the Presence of Radiation Particle Strikes

      • Rajesh Garg, Sunil P. Khatri

      Pages 59-70

   5. 3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits

      • Rajesh Garg, Sunil P. Khatri

      Pages 71-86

   6. Clamping Diode-based Radiation Tolerant Circuit Design Approach

      • Rajesh Garg, Sunil P. Khatri

      Pages 87-108

   7. Split-output-based Radiation Tolerant Circuit Design Approach

      • Rajesh Garg, Sunil P. Khatri

      Pages 109-127

4. Process Variations

   1. Front Matter

      Pages 130-130

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   2. Sensitizable Statistical Timing Analysis

      • Rajesh Garg, Sunil P. Khatri

      Pages 131-151

   3. A Variation Tolerant Combinational Circuit Design Approach Using Parallel Gates

      • Rajesh Garg, Sunil P. Khatri

      Pages 153-171

   4. Process Variation Tolerant Single-supply True Voltage Level Shifter

      • Rajesh Garg, Sunil P. Khatri

      Pages 173-188

   5. Conclusions and Future Directions

      • Rajesh Garg, Sunil P. Khatri

      Pages 189-193

5. Back Matter

   Pages 1-17

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This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.

• Crosstalk
• EDA
• Power Supply Variation
• Radiation Effects
• Resilient VLSI Design
• Soft Errors
• VLSI
• VLSI Design
• algorithms
• circuit design
• design automation
• electronic design automation
• modeling
• simulation
• stability

• Hillsboro, U.S.A.

  Rajesh Garg

• Dept. Electrical & Computer Engineering, Texas A & M University, College Station, U.S.A.

  Sunil P. Khatri

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