International Research and Development

  • Kornel F. Ehmann
  • David Bourell
  • Martin L. Culpepper
  • Thom J. Hodgson
  • Thomas R. Kurfess
  • Marc Madou
  • Kamlakar Rajurkar
  • Richard Devor

Table of contents

  1. Front Matter
    Pages i-xxxiv
  2. Richard E. DeVor, Kornel F. Ehmann
    Pages 1-9
  3. Martin L. Culpepper, Thomas R. Kurfess
    Pages 11-28
  4. David Bourell, Kamlakar Rajurkar
    Pages 29-52
  5. Kamlakar Rajurkar, Marc Madou
    Pages 53-87
  6. Thomas R. Kurfess, Thom J. Hodgson
    Pages 89-109
  7. Marc Madou
    Pages 111-120
  8. Back Matter
    Pages 131-362

About this book


We have come to know that our ability to survive and grow as a nation to a very large degree depends upon our sci- tific progress. Moreover, it is not enough simply to keep abreast of the rest of the world in scientific matters. We 1 must maintain our leadership. President Harry Truman spoke those words in 1950, in the aftermath of World War II and in the midst of the Cold War. Indeed, the scientific and engineering leadership of the United States and its allies in the twentieth century played key roles in the successful outcomes of both World War II and the Cold War, sparing the world the twin horrors of fascism and tota- tarian communism, and fueling the economic prosperity that followed. - day, as the United States and its allies once again find themselves at war, President Truman’s words ring as true as they did a half-century ago. The goal set out in the Truman Administration of maintaining leadership in s- ence has remained the policy of the U. S. government to this day. Dr. John Marburger, the Director of the Office of Science and Technology (OSTP) in the Executive Office of the President, made remarks to that effect during 2 his confirmation hearings in October 2001. The United States needs metrics for measuring its success in meeting this goal of maintaining leadership in science and technology.


Feder Messtechnik Sensor automation communication development electronics integrated circuit laser machining manufacturing microelectromechanical system (MEMS) nanotechnology production tables

Authors and affiliations

  • Kornel F. Ehmann
    • 1
  • David Bourell
    • 2
  • Martin L. Culpepper
    • 3
  • Thom J. Hodgson
    • 4
  • Thomas R. Kurfess
    • 5
  • Marc Madou
    • 6
  • Kamlakar Rajurkar
    • 7
  • Richard Devor
    • 8
  1. 1.Northwestern UniversityEvanstonUSA
  2. 2.University of TexasAustinUSA
  3. 3.Massachusetts Institute of TechnologyCamridgeUSA
  4. 4.North Carolina State UniversityRaleighUSA
  5. 5.Clemson UniversityClemsonUSA
  6. 6.University of CaliforniaIrvineUSA
  7. 7.University of NebraskaLincolnUSA
  8. 8.University of IllinoisUrbanaUSA

Bibliographic information

  • DOI
  • Copyright Information Springer 2007
  • Publisher Name Springer, Dordrecht
  • eBook Packages Engineering
  • Print ISBN 978-1-4020-5948-3
  • Online ISBN 978-1-4020-5949-0
  • Buy this book on publisher's site
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