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Formal Techniques in Real-Time and Fault-Tolerant Systems

6th International Symposium,FTRTFT 2000 Pune, India, September 20–22, 2000 Proceedings

  • Mathai Joseph
Conference proceedings FTRTFT 2000

Part of the Lecture Notes in Computer Science book series (LNCS, volume 1926)

Table of contents

  1. Front Matter
    Pages I-X
  2. Invited Lectures

    1. N. Halbwachs, J. -F. Héry, J. -C. Laleuf, X. Nicollin
      Pages 1-11
  3. Model Checking

    1. Henrik Ejersbo Jensen, Kim Guldstrand Larsen, Arne Skou
      Pages 19-30
  4. Fault Tolerance

    1. K. Lano, David Clark, K. Androutsopoulos, P. Kan
      Pages 46-57
    2. Sandeep S. Kulkarni, Anish Arora
      Pages 82-93
    3. Hans Hansson, Christer Norström, Sasikumar Punnekkat
      Pages 94-105
  5. Scheduling

    1. K. Altisen, G. Gößler, J. Sifakis
      Pages 106-120
  6. Validation

    1. Stéphane Tudoret, Simin Nadjm-Tehrani, Albert Benveniste, Jan-Erik Strömberg
      Pages 134-151
    2. A. K. Bhattacharjee, Gopa Sen, S. D. Dhodapkar, K. Karunakar, Basant Rajan, R. K. Shyamasundar
      Pages 152-169
  7. Refinement

    1. Ron van der Meyden, Yoram Moses
      Pages 185-202
    2. R. -J. Back, L. Petre, I. Porres
      Pages 202-213
  8. Verification

    1. Leszek Holenderski
      Pages 214-227
    2. Simeon Veloudis, Nimal Nissanke
      Pages 228-239
  9. Logic and Automata

    1. Dimitar P. Guelev
      Pages 264-275
    2. Kai Baukus, Yassine Lakhnech, Karsten Stahl
      Pages 291-303
  10. Back Matter
    Pages 305-305

About these proceedings

Keywords

Automat Scheduling automata logic model checking real-time verification

Editors and affiliations

  • Mathai Joseph
    • 1
  1. 1.Tata Research Development and Design CentrePuneIndia

Bibliographic information

  • DOI https://doi.org/10.1007/3-540-45352-0
  • Copyright Information Springer-Verlag Berlin Heidelberg 2000
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-540-41055-3
  • Online ISBN 978-3-540-45352-9
  • Series Print ISSN 0302-9743
  • Buy this book on publisher's site
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