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The Core Test Wrapper Handbook

Rationale and Application of IEEE Std. 1500™

  • Authors
  • Francisco da Silva
  • Teresa McLaurin
  • Tom Waayers

Part of the Frontiers in Electronic Testing book series (FRET, volume 35)

Table of contents

  1. Front Matter
    Pages i-xxix
  2. Pages 1-1
  3. Pages 21-28
  4. Pages 77-129
  5. Pages 131-179
  6. Pages 181-186
  7. Pages 187-216
  8. Pages 217-220
  9. Back Matter
    Pages 273-276

About this book

Introduction

The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM

provides insight into the rules and recommendations of IEEE Std. 1500. The authors present background information about some of the choices and decisions made throughout the

design of this IEEE standard conceived to enable efficient core test reuse and debug at the

SOC level.

The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM focuses on practical design considerations and design choices inherent to the application of IEEE Std. 1500. This book teaches an engineer how to add a 1500 wrapper to their core in easy to understand steps. Starting with a bare core (a core without 1500 wrapper), the book progressively builds a 1500 compliant wrapper around this core while discussing overall requirements for each portion of the 1500 wrapper. The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM is a very valuable reference for professionals and researchers in the areas of design for test, design for test reuse/design reuse, and SOC implementation.

Keywords

SoC Standard design system on chip (SoC)

Bibliographic information

  • DOI https://doi.org/10.1007/0-387-34609-0
  • Copyright Information Springer Science+Business Media, LLC 2006
  • Publisher Name Springer, Boston, MA
  • eBook Packages Engineering
  • Print ISBN 978-0-387-30751-0
  • Online ISBN 978-0-387-34609-0
  • Series Print ISSN 0929-1296
  • Buy this book on publisher's site
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