Overview
- Provides a systematic approach to scattering of transient fields which can be introduced in undergraduate or graduate courses
- Has a braod appeal, to researchers in radiophysics and various engineering specialities as well as scientists in applied mathematics, computer science and computational physics
Part of the book series: Springer Series in Optical Sciences (SSOS, volume 122)
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Table of contents (7 chapters)
Keywords
About this book
Authors and Affiliations
Bibliographic Information
Book Title: Modeling and Analysis of Transient Processes in Open Resonant Structures
Book Subtitle: New Methods and Techniques
Authors: Yuriy K. Sirenko, Nataliya P. Yashina, Staffan Ström
Series Title: Springer Series in Optical Sciences
DOI: https://doi.org/10.1007/0-387-32577-8
Publisher: Springer New York, NY
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer-Verlag New York 2007
Hardcover ISBN: 978-0-387-30878-4Published: 14 November 2006
Softcover ISBN: 978-1-4899-8956-7Published: 19 September 2014
eBook ISBN: 978-0-387-32577-4Published: 03 April 2007
Series ISSN: 0342-4111
Series E-ISSN: 1556-1534
Edition Number: 1
Number of Pages: XIV, 353
Topics: Optics, Lasers, Photonics, Optical Devices, Theoretical, Mathematical and Computational Physics, Microwaves, RF and Optical Engineering, Information and Communication, Circuits
Industry Sectors: Aerospace, Electronics, Energy, Utilities & Environment, IT & Software, Telecommunications