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© 2004

Three-Dimensional X-Ray Diffraction Microscopy

Mapping Polycrystals and their Dynamics

  • Authors

Benefits

  • Up-to-date review

  • Novel experimentation technology

Book

Part of the Springer Tracts in Modern Physics book series (STMP, volume 205)

Table of contents

  1. Front Matter
  2. Henning F. Poulsen
    Pages 1-5
  3. Henning F. Poulsen
    Pages 21-34
  4. Henning F. Poulsen
    Pages 35-50
  5. Henning F. Poulsen
    Pages 51-72
  6. Henning F. Poulsen
    Pages 83-88
  7. Henning F. Poulsen
    Pages 89-94
  8. Henning F. Poulsen
    Pages 95-137
  9. Henning F. Poulsen
    Pages 137-145
  10. Henning F. Poulsen
    Pages 147-149
  11. Back Matter

About this book

Introduction

Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.

The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

Keywords

Grain dynamics Grain maps X-ray diffraction chemistry crystallography dynamics

Bibliographic information

  • Book Title Three-Dimensional X-Ray Diffraction Microscopy
  • Book Subtitle Mapping Polycrystals and their Dynamics
  • Authors Henning Friis Poulsen
  • Series Title Springer Tracts in Modern Physics
  • Series Abbreviated Title STMP
  • DOI https://doi.org/10.1007/b97884
  • Copyright Information Springer-Verlag Berlin/Heidelberg 2004
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Hardcover ISBN 978-3-540-22330-6
  • Softcover ISBN 978-3-662-14543-2
  • eBook ISBN 978-3-540-44483-1
  • Series ISSN 0081-3869
  • Series E-ISSN 1615-0430
  • Edition Number 1
  • Number of Pages XII, 156
  • Number of Illustrations 0 b/w illustrations, 0 illustrations in colour
  • Topics Condensed Matter Physics
    Crystallography and Scattering Methods
  • Buy this book on publisher's site
Industry Sectors
Energy, Utilities & Environment

Reviews

From the reviews:

"The aim of this book is to give a comprehensive account of 3DXRD microscopy, with a focus both on methodology and on applications. … the book may serve to stimulate research in other fields also, such as geophysics, geology, chemistry, and pharmaceutical science. In short, the book is a very sound and gainful enterprise with good focus … which is a welcome feature. Scientists working in the field will have cause to be elated at the prospect of acquiring and referring to the volume." (Current Engineering Practice, Vol. 47 (3), 2004-2005)